Method and device for measuring residual reflection of edge covering interface of optical gain medium

A technology of residual reflection and gain medium, which is used in measurement devices, measurement of scattering properties, material analysis by optical means, etc. It can solve the problem of inability to eliminate the absorption and scattering loss inside the laser glass and the reflection at the interface between the laser glass and the air.

Active Publication Date: 2013-09-18
HEFEI ZHICHANG PHOTOELECTRIC TECH
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Problems solved by technology

[0008] The technical problem to be solved by the present invention is to provide a method and device for measuring the residual reflection of the boundary surface of the optical gain medium, and solve the problem that the absorption and scattering loss inside the laser glass and the reflection of the laser glass and the air interface cannot be eliminated in the residual reflection measured problems, and is suitable for the measurement of both large-diameter samples and small-sized samples

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  • Method and device for measuring residual reflection of edge covering interface of optical gain medium
  • Method and device for measuring residual reflection of edge covering interface of optical gain medium
  • Method and device for measuring residual reflection of edge covering interface of optical gain medium

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[0042] Among various laser glass materials with amplification function, neodymium glass has become the most important laser glass material because it can generate laser light at room temperature, has small temperature quenching effect, high optical pump absorption effect string and high quantum efficiency of luminescence. In particular, ultra-large-sized neodymium glass has become the most mature and reliable amplification medium for high-power laser systems, and is widely used in various high-power laser devices in the world, such as the National Ignition Device of Livermore Laboratory in the United States and Shenguang II and III in my country. device etc.

[0043] Therefore, the following specific combination of Figure 10 , and take the measurement of the residual reflectivity of the neodymium glass-encased interface as an example to further elaborate the present invention, but this should not limit the protection scope of the present invention.

[0044] See Figure 10 , ...

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Abstract

The invention discloses a method and a device for measuring the residual reflection of an edge covering interface of an optical gain medium. Absorption and scattering losses in laser glass and influence caused by factors such as reflection of the laser glass and an air interface are directly eliminated by comparing the laser glass before and after edge covering, so that the residual reflection rate of the edge covering interface of the laser glass can be quickly and conveniently measured; furthermore, an incident angle and an incident point of incident light are changed by precision positioning of a laser glass clamping device, so that the residual reflection of the edge covering interface of the laser glass with different incident angles and in different measurement points can be conveniently measured.

Description

[0001] technical field [0002] The invention relates to the field of laser gain medium measurement, in particular to a method and device for measuring the residual reflection of the boundary surface of an optical gain medium package. Background technique [0003] Optical gain media are widely used in various types of solid-state lasers, and become the main laser materials of high-power and high-energy lasers. The laser gain medium is generally a solid laser material based on glass, which is composed of two parts: matrix glass and active ions. The various physical and chemical properties of laser glass are mainly determined by the matrix glass, while its spectral properties are mainly determined by the activated ions. [0004] According to the composition of laser glass, it has the following characteristics: First, there must be a metastable state in the light-emitting mechanism of activated ions, forming a three-level or four-level mechanism; and the metastable state i...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/55G01N21/01
Inventor 董敬涛吴周令陈坚
Owner HEFEI ZHICHANG PHOTOELECTRIC TECH
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