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A kind of chip programming method of nand flash memory chip and checkerboard check

A technology of flash memory chips and programming methods, applied in static memory, instruments, etc., can solve the problems of high cost and slow test speed, and achieve the effect of reducing test cost and shortening test time.

Active Publication Date: 2015-08-19
GIGADEVICE SEMICON (BEIJING) INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Although the above-mentioned traditional method of performing Check Board testing in the form of a Chip Program is simple, it has a disadvantage: the test speed is slow and the cost is high

Method used

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  • A kind of chip programming method of nand flash memory chip and checkerboard check
  • A kind of chip programming method of nand flash memory chip and checkerboard check
  • A kind of chip programming method of nand flash memory chip and checkerboard check

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Experimental program
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Effect test

Embodiment 1

[0027] Embodiment one, a kind of chip programming method of checkerboard checking of NAND flash memory chip, comprises:

[0028] The sequence that needs to be programmed is transferred to the cache; the sequence includes the first and second sequences; the first and second sequences are sequences that represent high and low levels alternately, wherein in the first sequence The first value of is the value representing the low level, and the first value in the second sequence is the value representing the high level; that is to say, the first and second sequences are opposite sequences;

[0029] After the sequences are all sent into the cache, use a programming instruction to transfer one of the first sequence and the second sequence in the cache to all singular pages in the main array of flash memory, and use another programming instruction to transfer the first sequence, the other sequence in the second sequence is transferred to all even-numbered pages in the main array...

Embodiment 2

[0037] Embodiment 2, a kind of NAND flash memory chip, comprises: main array, cache memory;

[0038] The transmission module is used to transmit the sequence that needs to be programmed to the cache; the sequence includes a first sequence and a second sequence; the first and second sequences are sequences that represent high and low levels alternately, Wherein the first value in the first sequence is a value representing a low level, and the first value in the second sequence is a value representing a high level;

[0039] The control module is used to transfer one of the first sequence and the second sequence in the cache to all singular pages in the main array with one programming instruction after the sequences are all transferred into the cache, and use another The programming instruction transfers the other of the first sequence and the second sequence to all even-numbered pages in the main array.

[0040] In this embodiment, the order of the two programming instr...

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PUM

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Abstract

The invention discloses an NAND flash memory chip and a chip programming method for a check board test of the NAND flash memory chip. The method comprises the steps that: sequences needing programming are sent into a buffer memory, wherein the sequences include a first sequence and a second sequence which express the alternative presence of the values of high level and low level, the first value in the first sequence is used for expressing the low level, and the first value in the second sequence is used for expressing the value of the high level; after the sequences are sent into the buffer memory, one of the first sequence and the second sequence in the buffer memory is sent into singular pages in a main array of the flash memory chip by a program instruction, and the other one of the first sequence and the second sequence is sent into pages with even numbers in the main array by another program instruction. According to the method, the Check Board test speed of the NAND Flash is improved, and the test cost is lowered.

Description

technical field [0001] The invention relates to the field of chip testing, in particular to a NAND flash memory chip and a chip programming method for checkerboard inspection thereof. Background technique [0002] In the NAND Flash (flash memory) test, there is an important and basic test, the basic process of which is: program the cell (unit) on the entire chip into a combination of "0" cell and "1" cell interval, and each " The surrounding four cells adjacent to the 0" cell are all "1", and the surrounding four cells adjacent to each "1" cell are all "0". This distribution diagram is also called "Check Board" )". figure 1 It is a schematic diagram of a part of the chip area when performing Check Board, including 9 cells arranged in 3 rows and 3 columns, and the three columns of cells are respectively connected to three bit lines BL <n-1>、BL <n>, BL<n+1> are connected, and the three rows of cells are respectively connected to the three read signals WL ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/10
Inventor 苏志强丁冲
Owner GIGADEVICE SEMICON (BEIJING) INC