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An embedded system method and device

An embedded system and test method technology, applied in the test field, can solve problems such as difficult implementation of test conditions, poor product quality assurance, insufficient test depth, etc., to achieve the effect of quality assurance

Active Publication Date: 2016-12-07
ANYKA (GUANGZHOU) MICROELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The embodiment of the present invention provides an embedded system testing method, which aims to solve the problem that the test depth is not enough or the test conditions are difficult to implement when the electronic product is tested manually, which leads to the problem that the quality of the product cannot be well guaranteed

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  • An embedded system method and device
  • An embedded system method and device
  • An embedded system method and device

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Embodiment Construction

[0017] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0018] In the embodiment of the present invention, the key information needed for the test is recorded, and when the test thread is started for automated testing, the key information is read and transmitted to the embedded system, allowing the system to execute the key information to complete related test operations.

[0019] figure 1 The implementation process of the embedded system testing method provided by the embodiment of the present invention is shown, and the details are as follows:

[0020] In step S101, record the button information that test needs;

[0021] In step S102, read the recor...

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Abstract

The invention is applicable to the field of test, and provides an embedded type system method and device. The method comprises the steps that key information required by test is recorded; the recorded key information is read and sent to an embedded type system, and the embedded type system is controlled to conduct corresponding test operation. By adopting the automation test method, the problem that test depth during manual test is not enough is resolved, some test conditions which are completed difficultly or can not be completed when test is executed in a manual mode are added to test of electronic products, and quality of the products is guaranteed better.

Description

technical field [0001] The invention belongs to the field of testing, in particular to an embedded system testing method and device. Background technique [0002] At present, the testing methods of electronic products basically adopt the method of manually pressing the buttons. Under the test of ensuring product quality, sufficient testing time is required. Since there are many and complex system modules that need to be tested for electronic products, when testers manually perform tests, there are many tasks and insufficient test time, so they will not conduct more in-depth tests on each module. In addition, under manual testing, some test conditions are difficult or impossible to implement. For example, for the stress test of recording, video, video playback, audio playback and other modules, it takes several hours or days to record a recording, and thousands of shots to take a photo. Or hundreds of thousands of photos, etc. [0003] Therefore, when electronic products ar...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
Inventor 黎兴建胡胜发
Owner ANYKA (GUANGZHOU) MICROELECTRONICS TECH CO LTD