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Micro-defect detection method on silicon steel plate surface based on salient active contour model

An active contour model, defect detection technology, used in optical testing flaws/defects, image data processing, instruments, etc.

Active Publication Date: 2016-07-13
NORTHEASTERN UNIV
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Problems solved by technology

[0005] Aiming at the problem of detection of tiny defects on the surface of silicon steel sheets under complex backgrounds, the present invention proposes a detection method for small defects on the surface of silicon steel sheets based on a significant active contour model to achieve the purpose of detecting small defects on the surface of silicon steel sheets

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  • Micro-defect detection method on silicon steel plate surface based on salient active contour model
  • Micro-defect detection method on silicon steel plate surface based on salient active contour model
  • Micro-defect detection method on silicon steel plate surface based on salient active contour model

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specific Embodiment approach

[0096] Such as image 3 As shown, the flow chart of positioning and detection of the method of combining the salient active contour model of an embodiment of the present invention, the specific implementation is as follows:

[0097] Step 3-1. Set the window function W k (x), the window used here is the widely used Gaussian window, the value of σ is 3, and the window size is 4σ+1.

[0098] Step 3-2, the local window function W k (x) into the following formula to get the local gray mean value: the gray mean value of pixels within the curve m 1 and the average gray value of pixels outside the curve m 2 The initial value of m 1 k and m 2 k , where φ is the level set function.

[0099] m 1 =mean(S∈({x∈Ω|φ(x)k (x)))

[0100] m 2 =mean(S∈({x∈Ω|φ(x)>0}∩W k (x)))

[0101] Step 3-3, put m 1 k and m 2 k Bring it into the following formula to get the initial value r of the data fidelity function r k , where k is the number of iterations, and S(x) represents the pixel dat...

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Abstract

The invention belongs to the field of intelligent detection and machine vision, and specifically discloses a method for detecting tiny defects on the surface of a silicon steel plate based on a significant active contour model, which mainly realizes accurate detection of tiny defects on the surface of a silicon steel plate under a complex background. The realization steps of the method of the present invention mainly include: firstly adopting the visual salience method to detect the collected surface image of the silicon steel plate to judge whether the image is a defect image; Experimental results show that although the background of the surface of the silicon steel plate is relatively complex, which brings great challenges to the detection of micro-defects, the method of the present invention can accurately detect and locate all surface micro-defects including point defects and dent defects.

Description

technical field [0001] The invention belongs to the field of intelligent detection and machine vision, and in particular relates to a method for detecting tiny defects on the surface of a silicon steel plate based on a significant active contour model. Background technique [0002] Silicon steel plate is an important soft magnetic material, mainly used as the iron core of transformers and various motors. Its production process is complicated and the manufacturing technology is strict. Foreign production technologies are protected in the form of patents, which are regarded as the life of the enterprise. Due to the limitation of production conditions, there will inevitably be different forms and types of defects on the surface of silicon steel sheets, and the size, number and distribution of defects vary greatly. The existence of surface defects seriously affects the smooth organization of silicon steel plate production and the improvement of product qualification rate, which...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00G01N21/88
Inventor 宋克臣颜云辉李骏胡少鹏
Owner NORTHEASTERN UNIV
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