Fault event analysis system and its analysis method
A fault event and analysis system technology, applied in the field of event analysis, can solve problems such as large amount of data to be processed, high complexity of program design, incorrect fault tree, etc., to reduce complexity, reduce the amount of data to be processed, composition and Simple and flexible design
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0045] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, so that those skilled in the art can better understand the present invention and implement it, but the examples given are not intended to limit the present invention.
[0046] First, if figure 1 As shown, a schematic diagram of a fault event analysis system according to an embodiment of the present invention, such as figure 2 As shown, a schematic diagram of the fault tree component architecture of an embodiment of the present invention, such as image 3 As shown, the fault tree assembly of an embodiment of the present invention is combined with a schematic diagram, such as Figure 4 A schematic diagram of a fault tree structure of an embodiment of the present invention is shown. The system includes a storage module 11 , an event setting module 12 and a computing module 13 .
[0047] The storage module 11 can be various components, devices or...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com