Device for detecting micro channel plate dark counts

A technology of micro-channel plate and dark counting, which is applied in measuring devices, radiation measurement, X/γ/cosmic radiation measurement, etc. It can solve the problem of small detection limit, limited galvanometer accuracy, and dark counting indicators that are not more accurate. data and other issues, to achieve the effect of wide application range and high measurement accuracy

Inactive Publication Date: 2014-04-09
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

At present, relevant domestic MCP development and production units have a relatively mature measurement method for gain, but there is no more accurate data for the dark count index. Generally, dark current is used to represent the dark noise of MCP.
There are two disadvantages to expressing the dark noise of MCP by dark current: 1) Limited by the accuracy of the ammeter, the ammeter has a minimum detection limit for dark current testing
If the dark current is below the detection limit, the exact value of ...

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  • Device for detecting micro channel plate dark counts
  • Device for detecting micro channel plate dark counts
  • Device for detecting micro channel plate dark counts

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[0032] The working conditions of the system will be described below by taking the position-sensitive anode 52 as an example using a four-wedge electrode (TWA / tetra wedge readout).

[0033] The TWA position sensitive anode used is as figure 2 As shown, the electronic part is mainly composed of charge sensitive preamplifier, Gaussian shaping main amplifier and so on. The specific working principle is the same as that described in the document "Imaging properties of a tetra wedge readout" (Chinese Physics B, 2011, 20(6): 068503).

[0034] The distance between the MCP2 to be tested and the input surface of the detector 5 is 0.5-1mm, and the acceleration voltage is about 500V. The working voltage of the micro-channel plate assembly 51 is 1600V-1800V, the distance between the micro-channel plate assembly 51 and the position-sensitive anode 52 is several to a dozen mm, and the accelerating voltage is about 300V. Firstly, the number and distribution of dark counts of the microchannel...

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Abstract

The invention provides a device for detecting micro channel plate dark counts. The device includes a vacuum chamber used for testing MCP performance, electrode leads, a photon counting imaging detector, an electronic readout circuit, a data acquisition and processing unit and a power supply; the photon counting imaging detector is arranged in the vacuum chamber; the electronic readout circuit and the data acquisition and processing unit are connected with the vacuum chamber sequentially; and the power supply is connected with the electrode leads and the photon counting imaging detector. According to the device for detecting the micro channel plate dark counts of the invention, information such as the number, position distribution and pulse height distribution (PHD) of MCP dark counts can be obtained simultaneously through using a photon counting imaging technology. With the device for detecting the micro channel plate dark counts adopted, low-noise MCP screening techniques can be provided for applications such as photon counting imaging detection, particle detection and low-light imaging.

Description

technical field [0001] The invention relates to the field of detection and imaging of electrons, ions and charged particles, in particular to a device for detecting the dark count of a microchannel plate. Background technique [0002] Microchannel plate (MCP) is a vacuum electron multiplier device with a thin sheet structure that can realize two-dimensional imaging detection. It uses the secondary electron emission characteristics of solids to achieve electron multiplication. MCP can be used to detect optical radiation from near-infrared to X-ray bands, and can also be used to directly multiply charged particles, electrons, ions, and cosmic rays, etc., with high gain, low power consumption, high resolution, fast response, and low noise. advantage. Various forms of imaging detectors can be formed by using MCP, such as photon counting imaging detection, particle detection and low-light night vision imaging and other fields. [0003] Since MCP is mainly used for the detection...

Claims

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Application Information

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IPC IPC(8): G01T1/00
Inventor 刘永安盛立志刘哲李林森赵宝升
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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