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Far field test system and test method for digital array secondary radar antenna pattern

An antenna pattern, secondary radar technology, applied in the direction of the antenna radiation pattern, etc., can solve the problem of high test requirements, and achieve the effect of fast processing speed and high precision

Active Publication Date: 2014-04-23
四川九洲空管科技有限责任公司
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Problems solved by technology

The existing far, medium and near-field test platforms for the antenna pattern test are basically based on fixed test sites, and the test process requires human intervention, and the test requirements are relatively high

Method used

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  • Far field test system and test method for digital array secondary radar antenna pattern
  • Far field test system and test method for digital array secondary radar antenna pattern
  • Far field test system and test method for digital array secondary radar antenna pattern

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Embodiment Construction

[0021] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0022] Any feature disclosed in this specification (including any appended claims, abstract and drawings), unless expressly stated otherwise, may be replaced by alternative features which are equivalent or serve a similar purpose. That is, unless expressly stated otherwise, each feature is one example only of a series of equivalent or similar features.

[0023] Such as figure 1 Shown, a kind of far-field test system of digital array secondary radar antenna pattern, comprises computer, data processing module, local oscillator module, tester, horn antenna, digital T / R component, array antenna and tu...

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Abstract

The invention provides a far field test system and test method for a digital array secondary radar antenna pattern. The test system comprises a computer, a data processing module, a local oscillator module, a tester, a horn antenna, a digital T/R assembly, an array antenna and a turntable; a digital array secondary radar antenna emission pattern test module determines all frequency points and digital array secondary radar antenna emission patterns at different scanning angles; a digital array secondary radar antenna receiving pattern test module determines all frequency points and the digital array secondary radar antenna receiving patterns at different scanning angles. The far field test system for the digital array secondary radar antenna pattern can be unfolded under any environment meeting the far field test distance conditions, can automatically finish all tests of the needed far field patterns without manual intervention, and is easy to implement in engineering.

Description

technical field [0001] The invention relates to a far-field test system and a test method for a digital array secondary radar antenna pattern, in particular to a system suitable for the field of secondary radar, which is used to deploy and test in any environment under the condition of a far-field test distance. All tests for the desired far-field pattern are done automatically. Background technique [0002] The core of the digital array secondary radar system is the digital T / R component, each channel of which is connected to one antenna element of the array antenna. Since the digital T / R component is an active component, its characteristics will change with time, and the Orientation is affected. The existing far, middle and near-field test platforms for the antenna pattern test are basically based on fixed test sites, and the test process requires human intervention, and the test requirements are relatively high. In order to test the performance of the digital array seco...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/10
Inventor 陈伟
Owner 四川九洲空管科技有限责任公司
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