Semiconductor package and method of fabricating same

A technology for semiconductors and packages, applied in the field of packages and manufacturing methods that can solve the offset of wafer-level semiconductor packaging grains, and can solve the problem of excessive offset and conductive blind holes that cannot be effectively electrically connected to electrode pads 110 and Problems such as line layer 152 and product yield drop have achieved the effect of improving alignment accuracy
CN103779299AInactive Publication Date: 2014-05-07SILICONWARE PRECISION IND CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SILICONWARE PRECISION IND CO LTD
Publication Date
2014-05-07
Estimated Expiration
Not applicable · inactive patent

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

A semiconductor package and a method of fabricating the same are provided. The semiconductor package includes an encapsulant having a top surface and a bottom surface opposite to the top surface; a semiconductor chip embedded in the encapsulant having an active surface, an inactive surface opposite to the active surface, and lateral surfaces interconnecting the active surface and the inactive surface, wherein the active surface protrudes from the bottom surface of the encapsulant and the semiconductor chip further has a plurality of electrode pads disposed on the active surface; a positioning member layer formed on a portion of the bottom surface of the encapsulant, covering the lateral surfaces of the semiconductor chip that protrude therefrom, and exposing the active surface; and a build-up trace structure disposed on the active surface of the semiconductor chip and the positioning member layer formed on the bottom surface of the encapsulant. Deviation of the semiconductor during package molding is prevented, and thus alignment precision of subsequent processes is effectively enhanced and the product yield is thus improved.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to a semiconductor package and a manufacturing method thereof, in particular to a package capable of solving wafer-level semiconductor packaging crystal grain offset and a manufacturing method thereof. Background technique

[0002] With the evolution of semiconductor technology, semiconductor products have developed different packaging product types. In order to pursue the lightness, thinness and shortness of semiconductor packages, a method that can provide more sufficient surface area to carry more input / output terminals ( I / O) or solder ball wafer level packaging (Wafer Level Chip Scale Package, WL-CSP), and can form a circuit redistribution layer on the semiconductor chip, and use the redistribution layer (redistribution layer, RDL) technology to reconfigure the chip on the solder pad to the desired position.

[0003] However, in the manufacturing method of this package, in order to simplify the processing steps and improve t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More