Electronic beam axial velocity measuring cavity with stray electron suppression function

Abstract

The invention provides an electronic beam axial velocity measuring cavity with a stray electron suppression function. The electronic beam axial velocity measuring cavity comprises a main cavity structure 100 and a collector cavity structure 200. The main cavity structure 100 comprises a main cavity body 101 and an electronic beam induction ring 106, and the electronic beam induction ring 106 is fixed to the inner side of the main cavity body 101 through an insulation ceramic ring 107 in a separating mode. The collector cavity structure 200 is communicated with the main cavity body 101, and an inner cavity of the collector cavity structure 200 is in a fusiform shape with the large middle portion and the two small ends. An electronic beam enters in an inlet of the main cavity structure 100 and enters in the collector cavity structure 200 through the inner side of the electronic beam induction ring 106. The influence of stray electronics on a measurement result can be reduced, and the measurement precision of electronic beam axial velocity can be improved.

Description

technical field [0001] The invention relates to the technical field of vacuum electronics, in particular to an electron beam axial velocity measurement cavity with the function of suppressing stray electrons. Background technique [0002] Electrovacuum devices are a type of active electronic devices that use electron beams to interact with high-frequency electromagnetic fields to achieve microwave power amplification and conversion functions in vacuum or gaseous media. Nowadays, electric vacuum devices are widely used in the fields of radar, electronic countermeasures, guidance and satellite communication. With the development of electric vacuum device technology, various electronic injection measurement systems have emerged. The axial velocity of the electron beam is an important property of the electron beam, and the measurement cavity is an important part of the measurement system of the axial velocity of the electron beam. [0003] figure 1 It is a structural schemati...

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Problems solved by technology

[0007] (1) The bombardment of the electron beam produces a large number of secondary electrons on the flat blind flange, which makes the measurement of the electron beam current inaccurate, and the secondary electron bombardment on the inner electrode of the capacitive probe will interfere with the electron beam induction voltage measurement;

[0008] (2) When the electron beam with a large lateral velocity passes through the capacitive probe, part of the edge electrons diverge and hit the inner electrode of the capacitive probe, which makes the induced voltage of the electron beam transmitted by the inner electrode wrong, and even has the risk of destroying the inner electrode

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