Power-on self-test circuit for discrete magnitude

A self-inspection circuit and discrete quantity technology, which is applied in the discrete quantity self-inspection method and circuit field, can solve problems such as high power consumption, and achieve the effect of reducing power consumption, less peripheral circuits, and simple circuits

Active Publication Date: 2014-06-11
西安翔腾微电子科技有限公司
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Problems solved by technology

[0003] The purpose of the present invention is to propose a discrete power-on self-test circuit, which can effectively solve the technical problem of high power consumption caused by peripheral devices in the prior art

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  • Power-on self-test circuit for discrete magnitude

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Embodiment Construction

[0017] The technical solution of the present invention will be clearly and completely described below in conjunction with the drawings and specific embodiments. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are It belongs to the protection scope of the present invention.

[0018] The principle of the self-check method of this embodiment is that the self-check type is determined according to the command register accessed for the first time. When the command 1 register is accessed first, when the 0 / 1 self-check is performed, the s0 issued at this time is "0" first, and then "1", "0" means the start of self-test (k1 is closed), and the discrete port signal is shielded (k0 is turned on); s1 is "0" and then "1", "0" means to shield the vref_hi port, "1 "Means using the v...

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Abstract

The invention discloses a self-test circuit for discrete magnitude. The technical problem of high power consumption caused by peripheral devices in the prior art can be effectively solved. According to the self-test circuit and a self-test method for the discrete magnitude, port signals are selected for comparison according to a self-test type, and a comparison result is compared with an instruction register to self-test each channel once; the self-test circuit is integrated in a discrete magnitude circuit chip, so that only vref_hi and vref_l0 are required to be provided by an external port, and few peripheral circuits are required; in addition, the circuit is simple in structure, and can be widely applied to discrete circuits, the power consumption is reduced, and the self-test cost is lowered.

Description

Technical field [0001] The invention belongs to the design technology for electronic circuits, and particularly relates to a discrete self-checking method and circuit. Background technique [0002] Discrete quantity circuits are commonly used in electromechanical systems to process discrete quantities of various channels. Whether the result after the discrete circuit processing is credible becomes a very important question. Traditional discrete signal processing uses peripheral devices and logic chips to build circuits to complete the self-check function. However, due to the large area occupied by peripheral devices, the power consumption of discrete self-check circuits is large. Moreover, the use of peripheral devices also improves the self-check cost. Summary of the invention [0003] The purpose of the present invention is to provide a discrete power-on self-check circuit, which can effectively solve the technical problem of high power consumption caused by peripheral devices...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/10
Inventor 田泽邵刚蔡叶芳郎静李世杰杨峰郭蒙王泉
Owner 西安翔腾微电子科技有限公司
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