Wafer cleaning equipment-based product tracking method and system
A technology for product tracking and cleaning equipment, which is applied in the direction of electrical components, semiconductor/solid-state device manufacturing, circuits, etc., and can solve problems such as inability to process products, record and query the operation process and status of wafer products, and inability to track wafer products , to achieve the effect of improving product yield
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[0038] The invention discloses a product tracking method based on wafer cleaning equipment. The tracking method specifically includes:
[0039] S1. Set the wafer cleaning equipment to several independent ID ports;
[0040] S2. Place the wafer products to be cleaned on the ID port in batches, and record the port ID corresponding to each batch of wafer products;
[0041] S3. The robotic arm in the wafer cleaning equipment sequentially grabs the wafers from an ID port, puts them into each cleaning unit for cleaning, and records the cleaning unit where each wafer is located and the cleaning time;
[0042] S4. Repeat step S3 to sequentially clean the wafer products on the remaining ID ports;
[0043] S5, obtain the port ID where each wafer is located, the cleaning unit and the cleaning time, and input them into the data report;
[0044] S6. If the wafer cleaning time in the data report is abnormal, track the port ID and cleaning unit where the wafer is located according to the da...
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