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Method for determining maximum deflection value of pre-stressed circular thin film under uniformly distributed load

A technology of evenly distributed load and maximum deflection, applied in the direction of measuring devices, instruments, etc., can solve problems such as loss of instrument accuracy

Inactive Publication Date: 2014-08-06
XUZHOU MASTON MOBILITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the problem of the circular thin film with prestress has not been solved analytically at present, but if the influence of prestress is not considered, it will definitely cause accuracy loss to problems such as instrumentation, instrument design and mechanical performance testing.

Method used

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  • Method for determining maximum deflection value of pre-stressed circular thin film under uniformly distributed load
  • Method for determining maximum deflection value of pre-stressed circular thin film under uniformly distributed load
  • Method for determining maximum deflection value of pre-stressed circular thin film under uniformly distributed load

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Embodiment Construction

[0017] Below in conjunction with accompanying drawing, technical scheme of the present invention is described in further detail:

[0018] Such as figure 1 As shown, the radius is a, the thickness is h, Young’s modulus of elasticity is E, Poisson’s ratio is ν, and the prestress is σ 0 The circular film is fixed and clamped at its circumference, and a transverse uniform load q is applied to it, then based on the static force balance analysis of the axisymmetric deformation problem of this circular film, using the load measurement value q, the maximum deflection value of the film w m can be determined by the following formula:

[0019] w m = ( a 4 q 2 hE ) 1 / 3 ...

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Abstract

The invention discloses a method for determining a maximum deflection value of a pre-stressed circular thin film under a uniformly distributed load. The method comprises the following steps: fixedly clamping the circular thin film with radius a, thickness h, elastic Young's modulus E, Poisson's ratio V and prestress sigma0 on circumference of the circular thin film, and applying a uniformly distributed load value q in the transverse direction, and therefore, through static equilibrium analysis on the basis of axisymmetrical deformation of the circular thin film, the maximum deflection value wm of the thin film is accurately determined through the measured value q of the load.

Description

technical field [0001] The invention relates to a method for determining the maximum deflection value of a prestressed circular film clamped around the periphery under the action of a uniformly distributed load. Background technique [0002] Membrane structures are widely used in many engineering fields. Because the membrane is very thin, it will show a large deflection under load, and its deformation problem is usually a geometric nonlinear problem. The accurate analytical solution of these nonlinear deformation problems is usually very difficult. Difficult, in most cases only numerical calculation results can be given. However, for many design problems such as diaphragm instruments and instruments, the design must be based on the exact analytical solutions of these thin film problems, and the numerical calculation results are usually difficult to meet this requirement. [0003] The loading structure of the prestressed circular film clamped around the periphery under the u...

Claims

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Application Information

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IPC IPC(8): G01B21/32
Inventor 孙俊贻何晓婷郑周练蔡珍红曹亮练永盛文江泉
Owner XUZHOU MASTON MOBILITY
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