Method for conducting pressure calibration on diffused silicon sensors through upper computer

Abstract

The invention discloses a method for conducting pressure calibration on diffused silicon sensors through an upper computer. The method is based on digital acquisition conducted on output of the diffused silicon sensors and based on temperature and pressure compensation conducted on acquired data. A device for conducting pressure calibration on the diffused silicon sensors comprises a microprocessor, a communication interface circuit, a sensor digitalization interface circuit and a data storage circuit. The method avoids the situation that the diffused silicon sensors are calibrated generally through adjustment of zero-point potentiometers and full-scale potentiometers in circuits in the calibration process of the diffused silicon sensors at present. The method overcomes the defects that precision drift of the diffused silicon sensors is caused by drift of the potentiometers in the circuits, the diffused silicon sensors cannot be calibrated in batches, and linear precision of the diffused silicon sensors cannot be adjusted. The method has the advantages that stability is good, the precision is high, temperature drift is little, and calibrating intellectualization is achieved.

Description

technical field [0001] The invention relates to the field of electronic automation, in particular to a method for calibrating the pressure of a diffused silicon sensor through a host computer. Background technique [0002] In the pressure calibration of the diffused silicon sensor, the usual practice is to use the standard pressure source to add zero point and full scale pressure to the diffused silicon sensor, and adjust the zero point and full scale potentiometer of the circuit to achieve the purpose of calibrating the diffused silicon sensor. Generally, this method has the advantage of simple debugging, but there are many problems in adjusting the hardware circuit: 1. Electronic components such as potentiometers are greatly affected by temperature, which can easily cause pressure calibration drift of diffused silicon sensors; 2. Due to Only the zero point and full-scale calibration of the diffused silicon sensor is carried out, so the linearity accuracy of the diffused si...

AI Technical Summary

Problems solved by technology

Generally, this method has the advantage of simple debugging, but there are many problems in adjusting the hardware circuit: 1. Electronic components such as potentiometers are greatly affected by temperature, which can easily cause pressure calibration drift of diffused silicon sensors; 2. Due to Only the zero point and full-scale calibration of the diffused silicon sensor is performed, so the linearity accuracy of the diffused silicon sensor in the entire range cannot be guaranteed; 3. The production and debugging are very complicated, and only one diffused silicon sensor can be calibrated at a time

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