Digital-to-analog conversion circuit single-event transient effect detection device and detection method

Abstract

The invention relates to a single-particle transient effect detection device and detection method for a digital-to-analog conversion circuit. Through the detection device and method, feature parameters which different types of single-particle transient effects need to capture and statistical analysis methods of the feature parameters are determined, a corresponding detection test device is developed, the generated single-particle transient effects and the feature parameters of the single-particle transient effects can be continuously detected and captured, record results can be sent back in real time, and statistic analysis according to the types of effects can be automatically achieved; through the detection device, continuous and automatic detection and capture and data analysis of single-particle transient effect signals are achieved, the problems that personal errors are caused by suspension of a test due to the fact that a manual recording mode is adopted for a single-particle transient effect testing device and follow-up statistic analysis efficiency is low at present are solved, the accuracy of test results is greatly improved, the testing efficiency is improved, the labor cost is lowered, and the capacity of a device to resist the single-particle transient effects can be effectively examined and evaluated.

Description

technical field [0001] The invention relates to a single-particle transient effect detection device and a detection method for a digital-to-analog conversion circuit, and belongs to the technical field of single-particle resistance test verification of microelectronic devices. [0002] technical background [0003] With the rapid development of semiconductor technology, the feature size and operating voltage of devices are getting smaller and smaller. Correspondingly, the critical charge is getting smaller and smaller, and the single event effect is becoming more and more obvious. The types and effects of single event effects also present a complex situation with the increase of types and functions of microelectronic devices. From the single single event latch effect in the past, it has evolved into complex multi-bit single event flipping, single event function interruption and single Particle transient effects. [0004] Digital-to-analog conversion circuits are widely used ...

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Problems solved by technology

[0006] The purpose of the present invention is to overcome the above-mentioned deficiencies of the prior art, to provide a digital-to-analog conversion circuit single event transient effect detection device, the detection device has realized the continuous automatic detection, capture and data analysis of the single event transient effect signal, and solved the current The human error caused by the suspension of the test caused by the manual recording of the single event transient effect test device, as well as the low efficiency of subsequent statistical analysis, greatly improved the accuracy of the test results, improved the test efficiency and saved labor costs, and can be effectively assessed and evaluated Device immunity to single event transient effects

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