A kind of preparation method of insect sample for scanning electron microscope
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- BEIJING UNIV OF AGRI
- Publication Date
- 2017-03-01
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a method for preparing an insect sample for a scanning electron microscope. Background technique
[0002] Insects are an important part of the animal kingdom. Scanning electron microscopes are widely used in the study of insect structures: scanning electron microscopes are widely used in insect physiology, insect anatomy, and insect systematics. A large number of relevant literature and practical operations show that the preparation of insect samples directly affects the objectivity and authenticity of the observation site.
[0003] Insect samples are generally prepared through steps such as sample cleaning, tissue fixation, dehydration, replacement, drying, and gold spraying. Because the overall insect material is large, and the outer skin of the insect has a certain degree of ossification, it is not easy for the fixative to penetrate the internal organs and tissues of the insect. Whether the ultrastructure of each part of t...