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A Feature Extraction Method for Attribute Scattering Centers of High-resolution SAR Image Targets

A technology of attribute scattering center and scattering center, which is applied in the field of radar, can solve problems such as inability to automate processing, inaccurate parameter estimation, and high complexity, and achieve the effects of reducing dictionary dimensions, improving estimation accuracy, and meeting automation requirements

Active Publication Date: 2016-08-17
XIDIAN UNIV
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Problems solved by technology

[0005] The purpose of the present invention is to propose a feature extraction method for attribute scattering centers of high-resolution SAR image targets to solve the problems of high complexity, inaccurate parameter estimation and incapable of automatic processing in existing methods

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  • A Feature Extraction Method for Attribute Scattering Centers of High-resolution SAR Image Targets
  • A Feature Extraction Method for Attribute Scattering Centers of High-resolution SAR Image Targets
  • A Feature Extraction Method for Attribute Scattering Centers of High-resolution SAR Image Targets

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Embodiment Construction

[0046] The technical solutions and effects of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0047] 1. Technical principle

[0048] A high-resolution SAR image is a two-dimensional scattering image of a target, which can be approximated as the sum of backscatter echoes from a small number of strong scattering centers. At present, there are three main models for extracting target scattering centers: ideal point scattering center model, attenuation index model, and attribute scattering center model. Among them, the attribute scattering center model is the most suitable for the scattering characteristics of SAR targets. It not only describes the location information and intensity information of the scattering center, but also describes the geometric size of the scattering center, as well as the dependence of the scattering center on frequency and azimuth, and can be reflected from this. The geometry of the perform...

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Abstract

The invention discloses a method for extracting characteristics of an attribute scattering center of high-resolution SAR (synthetic aperture radar) image targets and mainly solves the problem that an existing attribute scattering center extracting method is mismatched in models, high in computation complexity and inaccurate in parameter estimation and fails to meet the requirement for automation in target identification. The method includes steps of 1, extracting supportive connected areas of targets in radar images and automatically initializing parameters; 2, reducing dimensionality of dictionary by means of dictionary splitting according to an attribute scattering center model, and structuring a location parameter dictionary and an attribute parameter dictionary; 3, solving the problem about zero norm optimization to obtain a parameter set of the attribute scattering center of the targets. By the method, the attribute scattering center of the targets can be effectively extracted, geometric size of the targets and important parts thereof can be accurately estimated, and the requirement for automation in target identification is met.

Description

technical field [0001] The invention belongs to the technical field of radar, and relates to a feature extraction method of a radar target attribute scattering center, which can be used for estimating the geometric dimensions of a target and its important components, and providing important feature information for target classification and identification. Background technique [0002] Synthetic Aperture Radar (SAR) technology was developed in the 1950s and flourished in the past seven decades. Improving the spatial resolution of SAR and extracting effective target information has always been a research hotspot in the field of SAR. A high-resolution SAR image is a two-dimensional scattering image of a target, which can be approximated as the sum of backscatter echoes from a small number of strong scattering centers. Currently, the models used to extract target scattering centers are mainly divided into three types: ideal point scattering center model, attenuation index model...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01S13/90G06F19/00G01S7/41
CPCG01S7/41G01S13/90G01S13/9027
Inventor 刘宏伟王鹏辉刘俊杜兰王英华纠博
Owner XIDIAN UNIV