Method for improving sparse grain and dense grain of crammed clipped fabric and fabric woven through method

A thin and dense pattern and fabric technology, which is applied to dense weft cut fabrics and improves the thin and dense pattern of dense weft cut fabrics, can solve problems such as thin and dense lines on the surface of fabrics, achieve strong variety adaptability, improve internal quality, improve The effect of splitting strength

Inactive Publication Date: 2014-11-19
JIANGSU SHUNYUAN NEW MATERIAL TECH CO LTD
View PDF7 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Cut flower fabrics include warp cut flowers and weft cut flowers. Parts of the warp or weft yarns are woven into the fabric, and then the yarn floating on the fabric is cut off. The jacquard part of the weft cut flower fabrics currently on the market Changes in the arrangement of the weft yarns lead to changes in the tension of the warp yarns, causing dense lines to appear on the surface of the fabric after weaving, especially when the contrast between the depth of the warp yarns and the weft yarns is relatively strong.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for improving sparse grain and dense grain of crammed clipped fabric and fabric woven through method
  • Method for improving sparse grain and dense grain of crammed clipped fabric and fabric woven through method
  • Method for improving sparse grain and dense grain of crammed clipped fabric and fabric woven through method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0032] Bicycle pattern dense weft cut flower fabric

[0033] The fabric is interwoven with warp yarns, ground wefts, first flower wefts and second flower wefts, the warp yarns and ground wefts are interwoven to form the ground part of the fabric, and the warp yarns, the first flower wefts and the second flower wefts are interwoven to form the flower parts of the fabric. The flower part of the fabric is composed of the pattern of riding a bicycle and the points set between the patterns. The two rows of patterns are a cycle, in which the first row of patterns and the second row of patterns are opposite in direction and staggered; the weft yarns of the fabric are arranged in the following order: Repeat the order of 1 ground weft and 1 second flower weft 3 times, then repeat 2 times in the order of 1 ground weft, 1 first flower weft, and 1 second flower weft, and then follow the order of 1 ground weft, The sequence of 1 first flower weft is repeated 33 times, and finally 106 groun...

Embodiment 2

[0040] The arrangement ratio of the ground weft and the extra weft is 1:2, and the rest of the process parameters are the same as in Example 1, and the flower part is reduced by 8%, and the machine weft density on the flower part is 71 threads / inch.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method for improving sparse grain and dense grain of crammed clipped fabric and the fabric woven through the method. The amplification of the weft density of the pattern portion of the fabric is calculated, and weaving is carried out by adjusting the weft density according to the arrangement of ground weft and pattern weft. According to the method, under the condition of not changing original equipment, the effect of eliminating the sparse grain and the dense grain on the surface of the crammed clipped fabric is achieved by adjusting technological parameters, the operation is easy, the variety adaptability is good, and the method is suitable for the crammed clipped fabric of various pattern effects. The appearance quality of the fabric meets requirements, meanwhile, the internal quality of the fabric is improved by adjusting the weft density, and the splitting strength of the fabric is improved.

Description

technical field [0001] The invention belongs to the technical field of textiles, and relates to a processing method of a jacquard fabric, in particular to a method for improving the thin and dense patterns of a dense weft sheared fabric, and also relates to a dense weft sheared fabric woven by the method. Background technique [0002] Cut flower fabrics include warp cut flowers and weft cut flowers. Parts of the warp or weft yarns are woven into the fabric, and then the yarn floating on the fabric is cut off. The jacquard part of the weft cut flower fabrics currently on the market Changes in the arrangement of the weft yarns lead to changes in the tension of the warp yarns, causing dense lines to appear on the surface of the fabric after weaving, especially when the contrast between warp yarns and weft yarns is relatively strong, once the strength of the warp yarns changes, the surface of the fabric will appear more obvious sparse lines. [0003] In view of this, it is neces...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): D06H7/14
Inventor 张贤国
Owner JIANGSU SHUNYUAN NEW MATERIAL TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products