An In-situ Fine Spectral Analysis System for Planetary Surfaces

A spectral analysis and planetary surface technology, applied in the field of spectral analysis systems, to achieve the effects of light and small power consumption, reduced power consumption, and low power consumption

Active Publication Date: 2016-03-30
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0004] In the past three decades, imaging spectroscopy technology has achieved tremendous development, and has played an important role in mineral resources, environmental monitoring, precision agriculture and forestry, and military defense. While achieving the goal of identifying minerals on the surface of the planet, it also meets the special requirements of volume, weight and harsh environments. There are certain limitations in the existing technical methods

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  • An In-situ Fine Spectral Analysis System for Planetary Surfaces
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  • An In-situ Fine Spectral Analysis System for Planetary Surfaces

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Embodiment Construction

[0042] Combine below Figure 1 ~ Figure 4 A preferred embodiment of the present invention is given, and the features of the present invention are mainly described in further detail, rather than being used to limit the scope of the present invention:

[0043] see first figure 1 , figure 1 It is a schematic diagram of a specific embodiment of the present invention used for precise spectral analysis on planetary surfaces. Its calibration dust-proof module 1 adopts an ultrasonic motor to drive an integrated calibration dust-proof board and a pointing mirror to realize detection, calibration, dust-proof and heat preservation functions; its spectrum detection module 2 adopts dual-channel discrete detection and complex light Mechanism design realizes compact and lightweight target image and spectral data acquisition module for spectral analysis; its data acquisition and control module 3 adopts multi-radio frequency composite acousto-optic drive AOTF and serial workflow, which simpl...

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Abstract

The invention discloses an in-place fine spectral analysis system for the planetary surface. The system comprises a calibration dustproof module, a spectral analysis module, a data acquisition and control module, and a mounting base. The instrument employs a multi-radio-frequency composite acousto-optic drive technology and adopts dual-channel discrete detection to realize target image and spectral data acquisition for fine spectral analysis. A light rotating mechanism is adopted to drive an integrated calibration dustproof plate, and a pointing mirror is adopted in a matching mode so as to achieve the functions of planetary surface detection, calibration, dust prevention and heat preservation in harsh environments. A complex optical mechanism design is adopted to make the instrument compact, light and small. The instrument of the invention has the characteristics of high degree of integration, smallness, lightness and multiple functions, has the function of non-programmed self fine spectral analysis, can adapt to harsh planetary surface environments, and meets the requirements of deep-space planetary surface detection for novel instruments.

Description

Technical field: [0001] The present invention relates to a spectrum analysis system, in particular to an in-place fine spectrum analysis instrument, which adopts multi-radio frequency composite acousto-optic drive technology, combined with dual-channel discrete detection to achieve target image and spectrum data acquisition for spectrum analysis; The integrated calibration dust-proof plate driven by a light-duty rotating mechanism is equipped with a pointing mirror to realize the functions of detection, calibration, dust-proof and heat preservation; the complex optical mechanism design is adopted to realize the compactness and lightness of the instrument, which is especially suitable for In-situ fine spectral analysis applications in harsh environments such as planetary surface exploration. Background technique: [0002] Morphology and spectrometry are the main methods to study the structure and composition of matter, which are based on the spectral characteristics of differ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/36
Inventor 王建宇何志平王斌永李春来吕刚袁立银陈凯
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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