A General Hardware Testing System

A hardware testing and hardware technology, which is applied in the direction of single semiconductor device testing, etc., can solve problems such as low efficiency, repeated development, and cumbersome testing of hardware equipment, so as to simplify testing, reduce the probability of repeated development, and improve testing efficiency.

Active Publication Date: 2017-09-05
苏州伊欧陆系统集成有限公司 +1
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is at least to overcome problems such as complex, inefficient and repeated development of hardware equipment testing in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A General Hardware Testing System
  • A General Hardware Testing System
  • A General Hardware Testing System

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0026] figure 1 A schematic block diagram of a hardware testing system according to an embodiment of the present invention is shown.

[0027] Such as figure 1 As shown, the present invention provides a hardware testing system 10, including: a test information receiver 110 configured to receive information about the hardware to be tested; a hardware parameter database 145 configured to store input parameters of the hardware to be tested, the input The parameters correspond to the information of the hardware to be tested; the hardware protocol library 120 is configured to store the protocol of the hardware to be tested; the hardware adapter 130 is configured to be connected to the hardware to be tested and according to the protocol stored in the hardware protocol library The protocol in the test communicates with the hardware to be tested; and the test...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The present invention provides a general hardware testing system, comprising: a test information receiver configured to receive information about the hardware to be tested; a hardware parameter database configured to store input parameters of the hardware to be tested, and the input parameters are related to the hardware to be tested Corresponding to the information of the hardware under test; the hardware protocol library is configured to store the protocol of the hardware to be tested; the hardware adapter is configured to be connected to the hardware to be tested and communicate with the hardware to be tested according to the protocol stored in the hardware protocol library The test hardware communicates; and the test flow controller is configured to query the hardware parameter database according to the information of the hardware to be tested to obtain the input parameters, and connect to the hardware protocol library by querying the hardware protocol library. The hardware adapter and the hardware to be tested exchange data, so as to test the hardware to be tested to obtain a test result. The hardware testing system of the invention simplifies hardware equipment testing, improves testing efficiency, and reduces the probability of repeated development.

Description

technical field [0001] The present invention relates generally to the field of semiconductors, and more particularly to the field of testing hardware parameters. Background technique [0002] Hardware equipment, such as hardware test equipment in semiconductor testing. Semiconductor wafers are often subject to rigorous testing. Wafer testing is to perform needle testing on each die on the wafer. A probe (probe) made of gold wire as thin as a hair is installed on the detection head, and it is in contact with the contact (pad) on the die. Test its electrical, optical, mechanical and other physical and chemical properties, unqualified grains will be marked, and then when the wafer is cut into individual grains according to the grain, the marked unqualified grains will be eliminated , do not proceed to the next process, so as not to increase the manufacturing cost. [0003] Different hardware devices and wafers usually have different parameters. For example, the same type of ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26
Inventor 沈景山吕文波
Owner 苏州伊欧陆系统集成有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap