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Method and device for automatic testing of memory of intelligent mobile terminal

A smart mobile terminal and automated testing technology, applied in software testing/debugging, etc., can solve problems such as large memory usage and consumption of smart mobile terminals, no way to reduce RAM usage, and low test depth

Active Publication Date: 2015-01-28
GUANGDONG OPPO MOBILE TELECOMM CORP LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Now the smart mobile terminal software that supports the Android operating system has more and more powerful functions, faster and more frequent updates, and more and more memory occupation and consumption for smart mobile terminals.
It often happens that the memory problem of the smart mobile terminal directly causes the smart mobile terminal to freeze, the RAM usage remains high, or the RAM usage cannot be reduced even after uninstalling a lot of software, or even directly leads to the restart of the smart mobile terminal. Seriously affect the user experience of smart mobile terminals, and bring a very negative negative impact on the brand and reputation of smart mobile terminals, so now smart mobile terminal memory testing is an indispensable item in the smart mobile terminal test items
[0003] Existing smart mobile terminal memory testing technologies often carry out some memory-related free tests manually and manually. Due to limited manual energy, the memory tests performed are often not very comprehensive, and the test depth is not very deep. It is only the most basic memory test, which is difficult to completely solve the problems of freezing and restarting caused by the memory problem of the smart mobile terminal. At present, there is an urgent need for an automatic and intelligent method of testing the memory of the smart mobile terminal.

Method used

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  • Method and device for automatic testing of memory of intelligent mobile terminal
  • Method and device for automatic testing of memory of intelligent mobile terminal
  • Method and device for automatic testing of memory of intelligent mobile terminal

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Embodiment 1

[0063] Memory leaks are also called "storage leaks". The space dynamically opened by the dynamic storage allocation function is not released after use, resulting in the memory unit being occupied all the time. until the end of the program. (In fact, to put it bluntly, the memory space is not recycled after use) is the so-called memory leak.

[0064] The analogy of the memory leak image is "the storage space that the operating system can provide to all processes is being drained by a certain process", the end result is that the longer the program runs, the more and more storage space is occupied, and eventually all storage space is used up. The whole system crashes. So "memory leak" is from the operating system point of view. The storage space here does not refer to physical memory, but refers to the size of virtual memory, which depends on the size set in the disk swap area. A piece of memory requested by the program, if there is no pointer pointing to it, then this piece o...

Embodiment 2

[0090] This embodiment discloses a device for automatically testing the memory of an intelligent mobile terminal, which is applied to an intelligent mobile terminal using an Android operating system, and includes the following modules:

[0091] 1. Automatic test and judgment module for memory leaks of resident services,

[0092] This module is aimed at the background resident service of the smart mobile terminal of the Android operating system. By calling the random simulation user operation tool that comes with the Android operating system, it simulates random user operations for a specific t times on the smart mobile terminal to achieve the operating conditions for memory leaks. , and then according to the trend comparison of the memory usage records of the background resident service of the Android operating system, it is determined whether there is a leak problem in the memory of the resident service of the Android operating system background in the smart mobile terminal. ...

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Abstract

The invention discloses a method for automatic testing of a memory of an intelligent mobile terminal, which is applied to the intelligent mobile terminal using an Android operation system. The method comprises two parts, namely automatic testing and judgment of memory leakage problems of resident services of the intelligent mobile terminal, and automatic testing and judgment of memory leakage problems of a single application, so the completeness of the memory leakage testing is guaranteed, the testing frequency each time and the recording frequency of memory values can be set, the stronger memory testing can be performed, and the relevant quality of the memory of the intelligent mobile terminal using the Android operation system is furthest guaranteed. The method has the advantages that the whole testing process is the full-automatic process, so the participation of persons is not needed in the testing process; a testing result report is automatically generated after the testing is finished, so the testing efficiency of the memory is greatly improved.

Description

technical field [0001] The invention relates to the technical field of application of intelligent mobile terminals, in particular to an automatic test method and device for the memory of an intelligent mobile terminal. Background technique [0002] Now the smart mobile terminal software supporting the Android operating system has more and more powerful functions, faster and more frequent updates, and more and more memory occupation and consumption for the smart mobile terminal. It often happens that the memory problem of the smart mobile terminal directly causes the smart mobile terminal to freeze, the RAM usage remains high, or the RAM usage cannot be reduced even after uninstalling a lot of software, or even directly leads to the restart of the smart mobile terminal. Seriously affect the user experience of smart mobile terminals, and bring a very negative negative impact on the brand and reputation of smart mobile terminals, so now the memory test of smart mobile terminals...

Claims

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Application Information

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IPC IPC(8): G06F11/36
Inventor 何晓俊张星龙
Owner GUANGDONG OPPO MOBILE TELECOMM CORP LTD
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