Inspection and selection device for chip electronic components
A technology of electronic components and sheets, which is applied in the direction of measuring devices, measuring electricity, and measuring electrical variables, etc. It can solve the problems of releasing sheet-shaped electronic components, difficult to send sheet-shaped electronic components to each sub-box, and unable to take out sub-boxes and pallets. , to achieve the effect of preventing mixing
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[0054] First, while referring to the attached Figure 1 A representative embodiment of the inspection and sorting device for chip electronic components of the present invention will be described.
[0055] figure 1 It is a perspective view showing a structural example of a chip capacitor (chip electronic component) to be inspected and selected. figure 1 The chip capacitor 11 is composed of a capacitor body 12 made of a dielectric and a pair of electrodes 13 a and 13 b provided at both ends of the capacitor body 12 . The chip capacitor 11 is a chip capacitor using ceramics as a dielectric. The capacitor main body is made of ceramics, and has a plurality of electrode layers extending from each of the electrodes 13 a and 13 b alternately and parallel to each other inside. As this example, the width of the chip capacitor 11 is set to 0.3 mm, and the length is set to 0.6 mm.
[0056] figure 2 It is a front view which shows the structural example of the inspection and selection...
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