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Probabilistic Fatigue Life Prediction Using Ultrasonic Testing Data Considering EIFS Uncertainty

A technology of fatigue life and probability, applied in the direction of material analysis using acoustic/ultrasonic/infrasonic waves, processing detection response signals, measuring devices, etc., can solve problems such as systematic methods that rarely provide uncertainty quantification

Inactive Publication Date: 2018-12-07
SIEMENS AG
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, for EIFS derived from ultrasonic flaw detection data using the DGS method, few reported studies provide a systematic approach for unambiguous uncertainty quantification

Method used

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  • Probabilistic Fatigue Life Prediction Using Ultrasonic Testing Data Considering EIFS Uncertainty
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  • Probabilistic Fatigue Life Prediction Using Ultrasonic Testing Data Considering EIFS Uncertainty

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Embodiment Construction

[0028]Exemplary embodiments of the invention as described herein generally include a probabilistic fatigue life prediction system using ultrasonic non-destructive examination (NDE) data, and while the invention encompasses numerous modifications and alternative forms, specific embodiments of which are shown by way of example in the drawings , and describe in detail in the text. It should be understood, however, that there is no intention to limit the invention to the particular forms disclosed, but on the contrary, the invention is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention.

[0029] As used herein, the term "image" refers to multidimensional data composed of discrete image elements (eg, pixels for two-dimensional images and voxels for three-dimensional images). For example, an image may be a medical image of a subject acquired by computed tomography, magnetic resonance imaging, ultrasound, or any other medica...

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Abstract

The invention relates to a method for probabilistically predicting fatigue life in materials, comprising: sampling (41) a random variable with respect to the actual equivalent initial crack size (EIFS); generating (42) a fatigue crack growth equation for random variables of the parameters (lnC, m); and solve (43) the fatigue crack growth equation using these random variables. Reporting EIFS data is obtained by ultrasonically scanning the target object, recording the echo signal from the target object, and converting the echo signal amplitude to an equivalent reflector size using previously recorded values ​​from the scanned calibration block. Equivalent reflector size is included in reporting EIFS data.

Description

[0001] Cross References to Related Applications [0002] This application claims priority to Guan et al., U.S. Provisional Application Serial No. 61 / 620,087, entitled "Probabilistic Fatigue Life Prediction Using Ultrasonic Inspection Data Considering EIFS Uncertainty," filed April 4, 2012, the entirety of which The contents are hereby incorporated by reference. technical field [0003] This application relates to probabilistic fatigue life prediction methods using ultrasonic non-destructive examination (NDE) data. Background technique [0004] Fatigue crack growth is a common cause of failure for most brittle materials subjected to stress loading. For critical structural components, fatigue crack flaws need to be identified and accurately quantified to enable repair and maintenance of components to avoid catastrophic events. For reliable damage identification, non-destructive testing is an available technique. For large-scale structural components, such as generator rotor...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N29/44G01N17/00
CPCG01N29/4472G01N17/00G01N2203/0218G01N2291/0258G01N29/44G06F17/10G01N29/4418
Inventor 关雪飞张竞丹K.卡德奥周少华
Owner SIEMENS AG
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