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Drop test device

A technology of testing device and transmission device, which is applied in the field of testing, can solve the problems of failure to screen out such circuits, failure of accelerometers, weak impact resistance of circuits, etc., achieve stable, fast and high-precision lifting, reduce intervals, and improve testing efficiency Effect

Active Publication Date: 2015-04-08
HANGZHOU SILAN MICROELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] During the manufacturing process of the accelerometer, there may be a very small percentage of the accelerometer circuit that is weak in shock resistance, causing the accelerometer to fail
Existing test systems cannot screen out such circuits during testing

Method used

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Examples

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Embodiment Construction

[0026] The present invention is described below based on examples, but the present invention is not limited to these examples. In the following detailed description of the invention, some specific details are set forth in detail. The present invention can be fully understood by those skilled in the art without the description of these detailed parts. In order not to obscure the essence of the present invention, well-known methods, procedures, procedures, components and circuits have not been described in detail.

[0027] Additionally, those of ordinary skill in the art will appreciate that the drawings provided herein are for illustrative purposes and are not necessarily drawn to scale.

[0028] Figure 1a and 1b A perspective view and a right side view of the drop test device according to the embodiment of the present invention are respectively shown. The drop test device includes a touch LCD screen 1005 , a lift transmission unit 1001 , a circuit drop unit 1003 , a circui...

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PUM

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Abstract

The invention discloses a drop test device which comprises a circuit drop unit, a circuit recycling bin unit and a circuit recycling unit. When a drop groove opens, a to-be-tested object drops from the opening of the drop groove. The circuit recycling bin unit comprises an impact interface, a conical sector and a circuit guide-out tube, wherein the conical sector is provided with a bottom-end opening communicated with the circuit guide-out tube, the impact interfaces receives the to-be-tested object and turns to deliver the same to the conical sector, and the to-be-tested device flows out through the conical sector and the circuit guide-out tube. The circuit recycling unit receives the to-be-tested object flowed out of the circuit guide-out tube of the circuit recycling bin unit. The drop test device can test the impact resistance of the circuit of an acceleration meter, and products with high reliability can be screened out.

Description

technical field [0001] The present invention relates to testing techniques, and more particularly to drop test devices. Background technique [0002] With the rapid development of microelectronics technology, electronic devices such as accelerometers have been widely used in aerospace, military, industrial, automotive, and civilian fields. Especially in civil applications, with the popularization of Internet terminals, the accelerometer market is very extensive. The accelerometer is used to measure the magnitude and direction of the acceleration, and can be used in the Internet terminal to detect the motion state of the terminal. [0003] During the manufacturing process of accelerometers, there may be a very small percentage of accelerometer circuits that are weak in shock resistance, causing the accelerometer to fail. Existing test systems cannot screen out such circuits during testing. In order to be able to screen out such circuits in the test, the accelerometer is su...

Claims

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Application Information

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IPC IPC(8): G01M7/08
Inventor 吴欢欢符强魏建中
Owner HANGZHOU SILAN MICROELECTRONICS
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