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Chip automatic test device

An automatic testing device and a technology for testing positions, which can be applied to measuring device casings, single semiconductor device testing, etc., can solve the problems of inaccurate positioning, low efficiency, long cycle, etc., and achieve simple and effective pressing structure, accurate positioning, and convenient testing Effect

Active Publication Date: 2018-11-02
HANGZHOU YOUWANG ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the positioning of the test position of the chip in the existing test device is not accurate enough, and the positioning process is not smooth enough; the chip only falls by its own gravity in the track, the cycle is too long, and the efficiency is too low

Method used

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  • Chip automatic test device
  • Chip automatic test device
  • Chip automatic test device

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Embodiment Construction

[0030] Various embodiments of the invention will be described in more detail below with reference to the accompanying drawings. In the various drawings, the same elements are denoted by the same or similar reference numerals. For the sake of clarity, various parts in the drawings have not been drawn to scale.

[0031] Note that in this application, figure 1 The indicated vertical direction is the height direction, the left-right direction is the width direction, and the front-rear direction is the thickness direction.

[0032] Such as figure 1 As shown, the chip automatic test device of the present invention includes two test lines arranged in parallel, and the two test lines can automatically test the chip at the same time. Each test line includes a test area bottom plate 100 and an upper temporary storage area 1 , a test area 2 and a lower temporary storage area 3 located on the test area bottom plate 100 . The chip to be tested passes through the upper temporary storage...

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PUM

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Abstract

The invention relates to an automatic chip testing device. The automatic chip testing device comprises a test area; the test area comprises a test bottom rail, a test rail cover, a test blocking structure, a test pressing mechanism and a golden finger for testing; the test bottom rail and the test rail cover have two positions, namely a transmission position and a test position; at the transmission position, a rail in the test area is used for receiving a chip; the test bottom rail and the test rail cover can move from the transmission position to the test position under the action of the test pressing mechanism; and at the test position, the golden finger completes the automated testing of the chip. According to the automatic chip testing device, a pressure measurement mode is adopted by the testing part of the golden finger, a test socket of the golden finger is fixed on a lower panel, the chip can be positioned accurately by the motion of an upper pressure block air cylinder, and blocking of materials is difficult to occur.

Description

technical field [0001] The invention relates to a chip testing device, in particular to a chip automatic testing device. Background technique [0002] Semiconductor integrated circuits are currently widely used, and are in the growth stage in the world, especially in China, and are the main driving force for market development. Therefore, automatic test and classification technology is particularly important. The current automatic test device is mainly to block the chip by the blocking block, and the golden finger clamps the test. However, the positioning of the test position of the chip in the existing test device is not accurate enough, and the positioning process is not smooth enough; the chip only falls by its own gravity in the track, the cycle is too long, and the efficiency is too low. Contents of the invention [0003] In view of this, the purpose of the present invention is to provide an automatic chip testing device to solve at least one of the above-mentioned t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/04G01R31/26
Inventor 潘文杰
Owner HANGZHOU YOUWANG ELECTRONICS