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Profiler shutter

A profiler and instrument light technology, which is applied in the field of profiler shutters, can solve problems such as harshness, damage to profiler optical components, high temperature, etc., and achieve the effect of improving the service life

Active Publication Date: 2020-03-27
HEFEI BAISHENG SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the steel rolling industry, profilers are often used to detect the profile size of red steel online. However, the working conditions of online detection are generally harsh, and the on-site environment is high temperature and high humidity, which can easily cause damage to the optical components of the profiler.

Method used

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  • Profiler shutter
  • Profiler shutter
  • Profiler shutter

Examples

Experimental program
Comparison scheme
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Embodiment Construction

[0009] Such as figure 1 As shown, a profiler shutter includes a base plate 10, and the base plate 10 is provided with door openings 11a, 11b for the outgoing light and incident light of the profiler to pass through. Parallel shutters 20 , the shutters 20 are arranged on the base plate to move in a direction parallel to the base plate 10 , and the door openings 11a, 11b are located on the moving path of the shutters 20 . When the profiler is in working state, the shutter 20 is opened, and the light beam can pass through the shutter smoothly. When the profiler is not working, the shutter 20 is closed to avoid contamination of the optical components of the profiler by dust, water vapor and other substances, which greatly improves the performance of the profiler. service life

[0010] Such as figure 1 , 2 As shown in . connect.

[0011] Further, the wiping unit includes two rubber wiping strips 21a, 21b, and when the two rubber wiping strips 21a, 21b slide with the shutter 20...

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PUM

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Abstract

The invention belongs to auxiliary tools of optical measurement instruments and particularly relates to a contourgraph optical gate. The contourgraph optical gate includes a substrate. The substrate is provided with a door opening allowing emergent light and incident light of a contourgraph to pass. The substrate is further provided with a gate plate parallel to the surface of the substrate. The gate plate is arranged on the substrate and reciprocates in the direction parallel to the substrate. The door opening is located on the motion path of the gate plate. When the contourgraph is in a working state, the gate plate is opened, light beams can penetrate through the optical gate smoothly; when the contourgraph does not work, the gate plate is closed, so optical assemblies of the contourgraph are prevented from being contaminated by dust, moisture and other substances. Accordingly, the contamination resistance capability of the contourgraph is greatly improved, and the service life of the contourgraph is greatly prolonged.

Description

technical field [0001] The invention belongs to an auxiliary tooling of an optical measuring instrument, and in particular relates to a light gate of a profiler. Background technique [0002] A profiler is a device that uses optical principles to measure the cross-sectional profile of an object. Its main principle is to use a line light source to irradiate the surface of the object to be measured, and then collect the light profile on the surface of the object to be measured through the image acquisition unit, and then determine the cross-sectional profile of the object. Therefore, the profile The instrument generally includes two mirrors, the light-emitting and light-incoming mirrors. In the steel rolling industry, profilers are often used to detect the profile size of red steel online. However, the working conditions of online detection are generally harsh, and the on-site environment is high temperature and high humidity, which can easily cause damage to the optical compo...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24
Inventor 娄霆王俊武传华金纬
Owner HEFEI BAISHENG SCI & TECH