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Event related potential analyzing method based on paired sample T test

A technology of event-related potential and analysis method, which is applied in the field of event-related potential analysis based on paired sample T-test, and can solve problems such as difficulty in maintaining repeatability, difficulty in extracting ERP features, and poor signal-to-noise ratio of repeated stimulation times.

Active Publication Date: 2015-04-29
INST OF BIOMEDICAL ENG CHINESE ACAD OF MEDICAL SCI
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AI Technical Summary

Problems solved by technology

In order to obtain an ERP signal with a good signal-to-noise ratio, dozens or even hundreds of repeated external stimuli are usually required. On the one hand, repeated stimuli will inevitably cause sensory system fatigue, and it is difficult to maintain a completely consistent repeatability; On the one hand, it is not easy to prepare a large amount of stimulus materials, especially for more complex stimuli such as pictures and sounds with specific meanings.
[0004] In addition, previous ERP analysis mostly focused on the analysis of one or several ERP components (such as P1, N1, P3, etc.), but it has a clear physical meaning for ERP signals with fewer repeated stimulation times and poor signal-to-noise ratio. It is often difficult to identify the ERP components of different stimuli, which also makes it difficult to extract ERP features under different stimuli.

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  • Event related potential analyzing method based on paired sample T test
  • Event related potential analyzing method based on paired sample T test
  • Event related potential analyzing method based on paired sample T test

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Embodiment Construction

[0025] An event-related potential analysis method based on paired sample T-test of the present invention will be described in detail below with reference to the embodiments and the accompanying drawings.

[0026] A kind of event-related potential (Event-related Potentials, ERP) analysis method based on the paired sample T-test of the present invention, first utilizes EEG acquisition equipment to record multi-channel scalp EEG signals under two kinds of stimuli, and performs preliminary preprocessing ; secondly, extract the ERP signals under two kinds of stimuli; carry out the paired sample T test on the ERP signals of each lead under two kinds of external stimuli respectively, and obtain the significant difference period of each lead ERP signal under the two kinds of stimuli; Finally, by calculating the area surrounded by the two ERP signals in the significant difference period, the difference area distribution of all the leads of the whole brain in the significant difference p...

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Abstract

The invention relates to an event related potential analyzing method based on a paired sample T test. The method includes: designing an electroencephalogram induction experiment containing two kinds of stimulations, using electroencephalogram collecting equipment to record multiple associated scalp electroencephalogram signals, and performing preliminary preprocessing; extracting ERP signals under the two kinds of stimulations; performing paired sample T test on the ERP signals under the two kinds of stimulations to determine a time period with significant difference; calculating the difference area of the ERP signals under the two kinds of stimulations in the time period with significant difference, and drawing a brain electrical activity mapping to determine the difference brain areas. The method has the advantages that the significant difference time period of the ERP under the two kinds of stimulations, the brain electrical activity mapping based on the ERP waveform difference area is drawn, and the different brain area distribution in the significant difference time period is obtained; the method is significant to ERP researches which are poor in signal to noise ratio and unobvious in single component, and a new idea is provided to the stripping of the ERP signals and spontaneous electroencephalogram.

Description

technical field [0001] The invention relates to an event-related potential analysis method. In particular, it relates to an event-related potential analysis method based on paired-sample T-test that includes multiple external stimuli and has less repetitions of a single stimulus. Background technique [0002] EEG signals are the spontaneous and rhythmic electrical activity of brain cell populations recorded by electrodes, and can be divided into spontaneous EEG (Electroencephalo-graph, EEG) and event-related potentials (Event-related Potentials, ERP) Two kinds. Event-related potential is a kind of EEG signal induced by people when they perceive and process a specific stimulus event or perform a certain cognitive task. thinking, decision-making, and cognitive processing. Because the ERP signal has millisecond time resolution, good non-invasiveness, and the operation of the acquisition equipment is relatively simple, the signal has many applications in the study of brain fu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): A61B5/0476
CPCA61B5/316A61B5/369
Inventor 殷涛王欣刘志朋
Owner INST OF BIOMEDICAL ENG CHINESE ACAD OF MEDICAL SCI
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