Event related potential analyzing method based on paired sample T test
A technology of event-related potential and analysis method, which is applied in the field of event-related potential analysis based on paired sample T-test, and can solve problems such as difficulty in maintaining repeatability, difficulty in extracting ERP features, and poor signal-to-noise ratio of repeated stimulation times.
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[0025] An event-related potential analysis method based on paired sample T-test of the present invention will be described in detail below with reference to the embodiments and the accompanying drawings.
[0026] A kind of event-related potential (Event-related Potentials, ERP) analysis method based on the paired sample T-test of the present invention, first utilizes EEG acquisition equipment to record multi-channel scalp EEG signals under two kinds of stimuli, and performs preliminary preprocessing ; secondly, extract the ERP signals under two kinds of stimuli; carry out the paired sample T test on the ERP signals of each lead under two kinds of external stimuli respectively, and obtain the significant difference period of each lead ERP signal under the two kinds of stimuli; Finally, by calculating the area surrounded by the two ERP signals in the significant difference period, the difference area distribution of all the leads of the whole brain in the significant difference p...
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