Device and method for measuring transient absorbance of translucent thin film materials
A technology of thin film materials and measuring devices, which is applied in the direction of color/spectral characteristic measurement, etc., and can solve problems such as errors and inaccurate measurement results
Active Publication Date: 2017-05-31
哈尔滨晋蓉科技发展有限公司
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then use figure 1 The device shown in the figure measures the absorbance of the thin film material, and the measurement result may be inaccurate or even wrong due to the reflection of the material; figure 2 The device shown measures the absorbance of thin film materials, which may cause inaccurate or even wrong measurement results due to the transmission of the material
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[0038] The specific embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0039] The device for measuring transient absorbance of translucent thin film materials in this embodiment includes a femtosecond laser, and the outgoing light path of the femtosecond laser is divided into three beams, which are respectively pump light, probe light and reference light;
[0040] The pumping light is transmitted from the beam splitter BS1, then through half of the glass slide H1, through the polarizer P1, reflected by the dielectric film mirror M1, reflected by the dielectric film mirror M2, transmitted by the BBO crystal, and incident on the Chopper C, the light beam modulated by chopper C is reflected by dielectric film mirror M3, reflected by dichroic mirror DM, transmitted by beam splitter BS4, converged by lens L1, and incident on the surface of sample S; The dielectric film mirror M1 and the dielectric film mir...
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The invention provides a device and method for measuring transient absorbency of semitransparent thin film material, belonging to the technical field of photoelectric measurement. The method comprises the following steps: by combining the structure of the existing transparent material absorbency measurement device and the structure of a non-transparent material absorbency measurement device, adding output results of a silicon amplifier D1 and a silicon amplifier D2 in an adder based on the principle of the incidence light intensity equal to the sum of transmittance light intensity, reflection light intensity and absorbing light intensity, and calculating in a computer, thus finally realizing the measurement on the transient absorbency of semitransparent thin film material. The device and the method not only have the function of measuring the absorbency of the transparent material and non-transparent material in the prior art, but also has the function of measuring the absorbency of the semi-transparent material, which cannot be achieved in the prior art.
Description
technical field [0001] A device and method for measuring transient absorbance of translucent thin film materials belong to the technical field of photoelectric measurement. Background technique [0002] Nanofilms and translucent films are widely used in scientific experiments and practical applications due to their special optical properties. When light is incident on the surface of a thin film material, reflection, transmission, and absorption will occur simultaneously. The strength of absorption is represented by absorbance. Since absorbance is crucial to the properties of thin film materials, it is necessary to measure it. [0003] Femtosecond transient absorption (also known as femtosecond pump-probe) technology is an experimental method for measuring the carrier dynamics of thin film materials. Because this method is simple and easy to do, and does not damage the sample, this technology is a research The most commonly used experimental method in the field of ultrafast ...
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IPC IPC(8): G01N21/31
Inventor 吴文智韩秋菊柴志军孔德贵冉玲苓
Owner 哈尔滨晋蓉科技发展有限公司