Intelligent chip short-circuit device used for intelligent photovoltaic module testing

A technology of photovoltaic modules and smart chips, applied in the monitoring of photovoltaic systems, photovoltaic power generation, photovoltaic modules, etc., can solve problems such as the impact of test results, and achieve the effect of low cost, easy-to-understand and easy-to-operate methods

Active Publication Date: 2015-05-13
TRINA SOLAR CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, during component testing, the chip circuit with control functions will have a greater impact on the test results

Method used

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  • Intelligent chip short-circuit device used for intelligent photovoltaic module testing
  • Intelligent chip short-circuit device used for intelligent photovoltaic module testing
  • Intelligent chip short-circuit device used for intelligent photovoltaic module testing

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Embodiment Construction

[0018] In order to make the content of the present invention more clearly understood, the present invention will be further described in detail below based on specific embodiments and in conjunction with the accompanying drawings.

[0019] like Figure 1~3 As shown, a smart chip short-circuit device for smart photovoltaic module testing, which includes:

[0020] The first benign conductor metal sheet 1, the first benign conductor metal sheet 1 is used to electrically connect with the input terminal of the smart chip 8;

[0021] The second benign conductor metal sheet 2, the second benign conductor metal sheet 3 is used to be electrically connected to the output terminal of the smart chip 8, and there is a reserved space between the second benign conductor metal sheet 3 and the first benign conductor metal sheet 2 Short circuit interval area; when the smart photovoltaic module is working normally, the insulation between the first benign conductor metal sheet 1 and the second b...

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Abstract

The invention discloses an intelligent chip short-circuit device used for intelligent photovoltaic module testing. The intelligent chip short-circuit device comprises a first good conductor metal sheet, a second good conductor metal sheet and a short-circuit component, wherein the first good conductor metal sheet is electrically connected with an input end phase of an intelligent chip; the second good conductor metal sheet is electrically connected with an output end phase of the intelligent chip; a reserved short-circuit spacer region is arranged between the second good conductor metal sheet and the first good conductor metal sheet; the short-circuit component is arranged in the reserved short-circuit spacer region; during intelligent photovoltaic module testing, the short-circuit component is electrically connected with the first good conductor metal sheet and the second good conductor metal sheet respectively. The intelligent chip short-circuit device can eliminate interferences of an intelligent chip circuit during intelligent photovoltaic module testing, so that the testing reliability is improved; meanwhile, the intelligent chip short-circuit device has the characteristics of reliable performance, simple and feasible structure and relatively low cost.

Description

technical field [0001] The invention relates to an intelligent chip short-circuit device for testing an intelligent photovoltaic component. Background technique [0002] At present, the solar energy industry, as a low-carbon renewable energy source, is booming around the world, and the installation volume in various countries is increasing year by year. In this context, more advanced smart photovoltaic modules have emerged in the industry, which have greater technical advantages than ordinary modules and are very competitive in the market. Smart junction boxes are often used in new photovoltaic smart modules. Most of the existing intelligent junction boxes are connected with chip circuits with control functions between the input and output, which can control the output of components according to certain rules, in order to achieve corresponding intelligent effects. However, during component testing, the chip circuit with control functions will affect the test results to a la...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02S50/10
CPCH02S50/00Y02E10/50
Inventor 王永帅全鹏张圣成于俊夏登福夏吉东
Owner TRINA SOLAR CO LTD
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