Intelligent chip short-circuit device used for intelligent photovoltaic module testing

Abstract

The invention discloses an intelligent chip short-circuit device used for intelligent photovoltaic module testing. The intelligent chip short-circuit device comprises a first good conductor metal sheet, a second good conductor metal sheet and a short-circuit component, wherein the first good conductor metal sheet is electrically connected with an input end phase of an intelligent chip; the second good conductor metal sheet is electrically connected with an output end phase of the intelligent chip; a reserved short-circuit spacer region is arranged between the second good conductor metal sheet and the first good conductor metal sheet; the short-circuit component is arranged in the reserved short-circuit spacer region; during intelligent photovoltaic module testing, the short-circuit component is electrically connected with the first good conductor metal sheet and the second good conductor metal sheet respectively. The intelligent chip short-circuit device can eliminate interferences of an intelligent chip circuit during intelligent photovoltaic module testing, so that the testing reliability is improved; meanwhile, the intelligent chip short-circuit device has the characteristics of reliable performance, simple and feasible structure and relatively low cost.

Description

technical field [0001] The invention relates to an intelligent chip short-circuit device for testing an intelligent photovoltaic component. Background technique [0002] At present, the solar energy industry, as a low-carbon renewable energy source, is booming around the world, and the installation volume in various countries is increasing year by year. In this context, more advanced smart photovoltaic modules have emerged in the industry, which have greater technical advantages than ordinary modules and are very competitive in the market. Smart junction boxes are often used in new photovoltaic smart modules. Most of the existing intelligent junction boxes are connected with chip circuits with control functions between the input and output, which can control the output of components according to certain rules, in order to achieve corresponding intelligent effects. However, during component testing, the chip circuit with control functions will affect the test results to a la...

AI Technical Summary

Problems solved by technology

However, during component testing, the chip circuit with control functions will have a greater impact on the test results

Images