Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Self-adaptive compressed sampling imaging method based on Haar wavelet brother coefficient

A wavelet coefficient, compressive sampling technology, applied in the re-radiation of electromagnetic waves, radio wave measurement systems, and the use of re-radiation, etc., can solve problems such as application difficulties, lack of universality, and difficulty in achieving universality, and achieve good applications. Effects of foreground, reduced time required for reconstruction, increased imaging rate

Inactive Publication Date: 2015-05-27
西安西光创威光电有限公司
View PDF2 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In response to this problem, some researchers have developed a deterministic matrix that can be generated by hardware [4] ([4] E.Cand`es and J.Romberg, Robust signal recovery from incomplete observations, in Proceedings of the IEEE International Conference on Image Processing ,2006,1281–1284.), but these matrices are often designed for certain imaging applications, not universal
On the other hand, the compressive sensing reconstruction algorithm has high computational complexity. With the increase of image resolution, image reconstruction requires huge computing resources and takes tens of minutes or even longer, making it difficult to apply in practice.
In addition, most reconstruction algorithms require iteration, and the number of iterations is determined by parameters such as residual tolerance, and these parameters are often empirical values, which are only applicable to a certain type of signal, and it is difficult to be universal

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Self-adaptive compressed sampling imaging method based on Haar wavelet brother coefficient
  • Self-adaptive compressed sampling imaging method based on Haar wavelet brother coefficient
  • Self-adaptive compressed sampling imaging method based on Haar wavelet brother coefficient

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0081] In the present embodiment, the 1951USAF resolution test sheet of Edmund Company is selected as the target, and the target is a negative film, that is, the resolution pattern is transparent and the background is opaque, such as Figure 5 shown. Since the target pattern is relatively complex, the imaging performance of EWT-ACS can be well demonstrated by comparing the imaging effects of different resolution patterns of the target.

[0082] The process flow of the imaging method of the present invention is as follows: figure 2 shown, including the following steps:

[0083] step one:

[0084] According to the size of the target, select the benchmark resolution of 32×32 and the preset imaging resolution of 256×256, then the highest number of wavelet decomposition layers J=log 2 256 / 32=3;

[0085] Step two:

[0086] (1) Adjust the optical path so that the reflected light of the DMD can cover the entire target scene;

[0087] (2) Select the Haar wavelet as the wavelet b...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a self-adaptive compressed sampling imaging method based on a Haar wavelet brother coefficient. The method comprises the following steps: firstly acquiring all wavelet coefficients under a target standard resolution by using a digital micromirror device (DMD); then from the standard resolution, predicting the next layer non-sampled important wavelet coefficient position from the layer sampled coefficient by combining a predetermined wavelet important threshold value according to the relationship between a Haar wavelet father and son coefficient and a brother coefficient, and configuring a wavelet base by using the DMD, and sampling the important wavelet coefficients to obtain a wavelet coefficient matrix with relatively high resolution; repeating predicting and sampling processes till the predetermined imaging resolution is reached to stop sampling, and carrying out wavelet inverse transform to obtain a target scene image. By combining the Haar wavelet brother coefficient information, the predicting precision of the important wavelet coefficient position is improved, the number of times of measurement required by DMD sampling is reduced, and the imaging quality and the imaging speed are improved.

Description

technical field [0001] The invention relates to an imaging technology suitable for a single-arm intensity correlation imaging laser radar system, in particular to an adaptive compression sampling imaging method based on an extended wavelet tree. Background technique [0002] Intensity-correlated imaging, also known as ghost imaging, is a new imaging method developed in recent years ([1] D.V. ‖ Phys. Rev. Lett. 74, 3600–3603 (1995).). In this method, the light emitted by the light source is divided into two paths: one is the signal light path, which illuminates the target, and uses a single-pixel barrel detector to record the light intensity of the target's reflected echo; the other is the reference light path, which uses a high-resolution area array to detect The device obtains the two-dimensional intensity distribution information of the light source. After multiple measurements, the image information of the target can be obtained by measuring the intensity correlation fu...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01S17/89
CPCG01S7/48G01S17/89
Inventor 赵铁鹍孙香冰樊安仓孟丽娜王龙飞罗永强
Owner 西安西光创威光电有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products