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Detection apparatus and method for machine vision

A technology of equipment and viewpoint, applied in the direction of optical testing flaws/defects, etc., can solve problems such as distortion error, position error, detection and accuracy impact

Active Publication Date: 2015-06-03
IND TECH RES INST
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Variations in the placement and rotation of objects can cause positional and / or distortion errors and negatively impact detection and accuracy
Also, variations from object to object on the same line can negatively impact detection and accuracy

Method used

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  • Detection apparatus and method for machine vision
  • Detection apparatus and method for machine vision
  • Detection apparatus and method for machine vision

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Embodiment Construction

[0028] The present invention will be described more fully hereinafter with reference to the accompanying drawings, in which embodiments of the invention are shown. However, the invention may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will inform the art of to fully convey the scope of the invention to those skilled in the art. Reference may be made herein to the location of numerous mathematical or numerical operations, values, and various elements and the like. It should be understood, however, that these expressions, values, positions, etc. may refer to absolute or approximate expressions, values, or positions such that embodiments may encompass variations that may occur in multi-channel optical units, for example due to engineering errors. Variety. Hereinafter, the same or similar reference numerals represen...

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Abstract

The invention discloses a detection apparatus and method for machine vision. The method for detecting machine vision includes the steps of providing depth information about a target obtained by an image capturing system, and determining the instant three-dimension information about a target object in a predetermined detection area according to at least one piece of the depth information obtained by the image capturing system. The method further includes the step of projecting the color pixel information of an instant color image of the target object onto a three-dimension virtual model according to the instant three-dimension information. The instant color image can be obtained by a color camera. The method further includes the step of producing a color three-dimension virtual model. The color three-dimension virtual model includes the color pixel information.

Description

technical field [0001] The present invention relates to an inspection device and method, and more particularly to a machine vision inspection device and method for inspecting a target object using three-dimensional information. Background technique [0002] The use of machine vision has increased over the past two to three decades, and machine vision plays an important role in the design of automated manufacturing systems. Products as diverse as printed circuit boards (PCBs), integrated circuits, liquid crystal displays (LCDs), transistors, auto parts, agricultural machinery, and other products manufactured in factories may require Inspections are carried out during the production process. Improperly manufactured components may cause extensive damage to, render wholly or at least partially useless, ineffective, or at least incapable of functioning adequately, or otherwise damage a system containing the improperly manufactured component. Therefore, there is a need to ensure...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
Inventor 戴崇礼邱治凯蔡曜阳
Owner IND TECH RES INST
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