Check patentability & draft patents in minutes with Patsnap Eureka AI!

Test method of nand FLASH management software

A management software and testing method technology, applied in the testing field of NANDFLASH management software, can solve problems such as time and low efficiency affecting product launch, and achieve the effect of reducing testing time and saving testing expenses.

Active Publication Date: 2018-04-27
HUIZHOU DESAY SV AUTOMOTIVE
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, passing the power-down test often requires more than tens of thousands of times to trigger the data migration mechanism, which takes several days to several weeks, and the efficiency is low, which greatly affects the time of product launch

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test method of nand FLASH management software

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0012] The testing method of the NAND FLASH management software of the present invention will be further described in detail below in conjunction with specific embodiments and accompanying drawings.

[0013] In one embodiment, the testing method of NAND FLASH management software of the present invention is applied to such as figure 1 In the system shown, the system includes a processor, a NAND FLASH controller (hereinafter referred to as the controller) connected to the processor, and a NAND FLASH memory (hereinafter referred to as the memory) connected to the processor through the controller. In addition, the processor is also connected with an external computer device through a serial communication interface. The controller is the bridge connecting the processor to the memory, and is mainly responsible for controlling read and write and ECC (Error Correcting Code, Error Checking and Correcting Code) verification operations.

[0014] In this embodiment, the processor is an A...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a testing method of NAND FLASH management software, which adopts logical reading when reading data in NAND FLASH memory, and uses physical direct writing mode to quickly trigger NAND FLASH management software when writing data in NAND FLASH memory The unique data migration mechanism can reduce product testing time and save testing costs. This test method can be applied to different NAND FLASH management software of different operating systems.

Description

technical field [0001] The invention relates to a testing method, in particular to a testing method of NAND FLASH management software. Background technique [0002] NAND FLASH memory is a kind of flash memory. It adopts nonlinear macrocell mode inside, which provides a cheap and effective solution for the realization of solid-state large-capacity memory. NAND-FLASH memory has the advantages of large capacity and fast rewriting speed, and is suitable for the storage of large amounts of data, so it has been more and more widely used in the industry, such as embedded products including digital cameras, MP3 walkman memory cards, volume Small U disk, etc. However, NAND FLASH memory is prone to bit reversal, and reliable NAND FLASH management software must be equipped to ensure the reliability of NAND FLASH memory. [0003] The principle of the existing NAND FLASH management software is to trigger the data transfer mechanism when the flip bit of NAND FLASH reaches the designed c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36G06F11/10
Inventor 袁健明
Owner HUIZHOU DESAY SV AUTOMOTIVE
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com