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Driving chip, driving board and method for testing same, and display device

A technology of driving chips and driving boards, which is applied in the direction of measuring devices, measuring electronics, static indicators, etc., and can solve problems such as short circuit, circuit burnout, and affecting product quality

Inactive Publication Date: 2015-06-24
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, in the prior art, for small display devices, such as mobile phones, palmtop computers, etc., due to the limitation of structural size, the size of the above-mentioned I / O interface 100 will be reduced in the design process, and the size of the two adjacent I / O interfaces will be reduced. The distance between 100
In this way, due to the manufacturing tolerance of the I / O interface 100, two adjacent I / O interfaces 100 may overlap and directly contact to cause a short circuit. produced, seriously affecting the quality of the product

Method used

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  • Driving chip, driving board and method for testing same, and display device
  • Driving chip, driving board and method for testing same, and display device
  • Driving chip, driving board and method for testing same, and display device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0043] Such as image 3 As shown, the input unit 10 may include a first switch S1, one end of which is connected to the test signal input terminal Vtest, and the other end is connected to the test unit 30 .

[0044] Specifically, when the first switch S1 is turned on, the signal input from the test signal input terminal Vtest can be transmitted to the test unit 30 . Further, the input unit 10 can also include a current limiting resistor R, through which the current limiting resistor R can reduce the input from the test signal input terminal Vtest to the test unit 30 or the first internal interface I / O. 1 , so as to avoid the excessive current input by the test signal input terminal Vtest, which will cause the internal device of the test unit 30 or the first internal interface I / O 1 burn.

[0045] Wherein, the resistance value of the above-mentioned current-limiting resistor R can be between 180Ω-330Ω. When the resistance value of the current-limiting resistor R is less than ...

Embodiment 2

[0062] On the basis of Example 1, as Figure 4 As shown, the test circuit 01 also includes the first internal interface I / O 1 Between the first switch S1 and the second internal interface I / O 2 Between the second switch S2, or the third internal interface I / O 3 The control switch between two adjacent test switches (the first test switch Sc1 and the second test switch Sc2) in series is used to control the I / O to the first internal interface 1 , the second internal interface I / O 2 or the third internal interface I / O 3 On-off of the input signal.

[0063] Specifically, for the convenience of description, the first internal interface I / O can be 1 The control switch between the first switch S1 and the first control switch Sk1 is called the first control switch Sk1, and the second internal interface I / O 2 The control switch between the second switch S2 is called the second control switch Sk2, and the third internal interface I / O 3 The control switch between two adjacent test ...

Embodiment 4

[0089] Such as Figure 6 As shown, the driving board 30 may include at least two driving chips, namely a first driving chip IC1 and a second driving chip IC2 ; and may also include a NOR gate 31 and an inverter 32 .

[0090] Wherein, the first input terminal of the NOR gate 31 is connected with the test signal output terminal Vo1 of the first driver chip IC1, the second input terminal is connected with the test signal output terminal Vo2 of the second driver chip IC2, and the output terminal is connected with the inverting The input terminal of the inverter 32 is connected, and the output terminal of the inverter 32 is connected to the feedback signal output terminal ORB on the driving board 30 .

[0091] In this way, the logical relationship of the NOR gate 31 can be known, such as Figure 7 or Figure 8 As shown, when one of the test signal output terminal Vo1 of the first driver chip IC1 or the test signal output terminal Vo2 of the second driver chip IC2 is at a high lev...

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PUM

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Abstract

An embodiment of the invention provides a driving chip, a driving board and a method for testing the same, and a display device, and relates to the field of display drivers. The driving chip comprises a first internal interface, a second internal interface and a test circuit. The test circuit is used for detecting short circuit and comprises an input unit and a test unit; the input unit is connected with a test signal input end, the test unit and the first internal interface. The test unit is connected with the first internal interface, the second internal interface and a test signal output end. The driving chip, the driving board and the method for testing the same, and the display device have the advantage that whether short circuit of the interfaces on the driving chip occurs or not can be detected.

Description

technical field [0001] The invention relates to the field of display driving, in particular to a driving chip, a driving board, a testing method thereof, and a display device. Background technique [0002] TFT-LCD (Thin Film Transistor Liquid Crystal Display, Thin Film Transistor Liquid Crystal Display), as a flat panel display device, has become more and more popular due to its small size, low power consumption, no radiation and relatively low production cost. It is widely used in the field of high-performance display. [0003] The TFT-LCD display device may include an LCM (Liquid Crystal Module, liquid crystal display module), and the LCM includes a liquid crystal display panel, a peripheral drive circuit, such as figure 1 The control circuit board 11, the backlight module and other components are shown. Wherein, the control circuit board 11 is provided with a display driving circuit, which can input control signals to make the display device display images. The control...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G09G3/36G09G3/00G01R31/00
CPCG09G3/006G09G2330/04G09G3/36G02F1/1309G02F1/13306G02F1/1368G09G3/3648G09G2310/08
Inventor 徐帅张郑欣王智勇
Owner BOE TECH GRP CO LTD