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A driving chip, a driving board, a testing method thereof, and a display device

A technology for driving chips and testing methods, applied in measuring devices, measuring electronics, static indicators, etc., can solve problems affecting product quality, circuit burnout, short circuits, etc.

Inactive Publication Date: 2017-02-22
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, in the prior art, for small display devices, such as mobile phones, palmtop computers, etc., due to the limitation of structural size, the size of the above-mentioned I / O interface 100 will be reduced in the design process, and the size of the two adjacent I / O interfaces will be reduced. The distance between 100
In this way, due to the manufacturing tolerance of the I / O interface 100, two adjacent I / O interfaces 100 may overlap and directly contact to cause a short circuit. produced, seriously affecting the quality of the product

Method used

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  • A driving chip, a driving board, a testing method thereof, and a display device
  • A driving chip, a driving board, a testing method thereof, and a display device
  • A driving chip, a driving board, a testing method thereof, and a display device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0043] Such as image 3 As shown, the input unit 10 may include a first switch S1, one end of which is connected to the test signal input terminal Vtest, and the other end is connected to the test unit 30.

[0044] Specifically, when the first switch S1 is turned on, the signal input from the test signal input terminal Vtest can be transmitted to the test unit 30. Further, the input unit 10 may also include a current-limiting resistor R, through which the current-limiting resistor R can reduce the input from the test signal input terminal Vtest to the test unit 30 or the first internal interface I / O. 1 The current of the test signal input terminal Vtest is too large to avoid the components inside the test unit 30 or the first internal interface I / O 1 burn.

[0045] Wherein, the resistance value of the above-mentioned current limiting resistor R may be between 180Ω and 330Ω. When the resistance value of the current limiting resistor R is less than 180Ω, the current limiting effect is...

Embodiment 2

[0062] On the basis of Example 1, such as Figure 4 As shown, the test circuit 01 also includes an I / O set on the first internal interface 1 Between the first switch S1, the second internal interface I / O 2 Between the second switch S2, or the third internal interface I / O 3 The control switch between two adjacent test switches (the first test switch Sc1 and the second test switch Sc2) connected in series is used to control the I / O to the first internal interface 1 , The second internal interface I / O 2 Or third internal interface I / O 3 The on-off of the input signal.

[0063] Specifically, for the convenience of description, the first internal interface I / O can be 1 The control switch between the first switch and the first switch S1 is called the first control switch Sk1, and the second internal interface I / O 2 The control switch between and the second switch S2 is called the second control switch Sk2, and the third internal interface I / O 3 The control switch between the two adjacent ...

Embodiment 4

[0089] Such as Image 6 As shown, the driving board 30 may include at least two driving chips, which are a first driving chip IC1 and a second driving chip IC2; and may also include a NOR gate 31 and an inverter 32.

[0090] Among them, the first input terminal of the NOR gate 31 is connected to the test signal output terminal Vo1 of the first driving chip IC1, the second input terminal is connected to the test signal output terminal Vo2 of the second driving chip IC2, and the output terminal is connected to the inverting The input terminal of the inverter 32 is connected, and the output terminal of the inverter 32 is connected to the feedback signal output terminal ORB on the driving board 30.

[0091] In this way, the logical relationship of the NOR gate 31 can be known, such as Figure 7 or Figure 8 As shown, when one of the test signal output terminals Vo1 of the first driver chip IC1 or the test signal output terminals Vo2 of the second driver chip IC2 is high, it is proved th...

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PUM

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Abstract

Embodiments of the present invention provide a driving chip, a driving board, a testing method thereof, and a display device, which relate to the field of display driving and can detect whether an interface on the driving chip is short-circuited. The drive chip includes a first internal interface and a second internal interface, and also includes a test circuit for short circuit detection. The test circuit includes an input unit and a test unit; the input unit is respectively connected to the test signal input end, the test unit and the first internal interface. The test unit is respectively connected to the first internal interface, the second internal interface and the test signal output end.

Description

Technical field [0001] The invention relates to the field of display driving, in particular to a driving chip, a driving board, a test method thereof, and a display device. Background technique [0002] TFT-LCD (Thin Film Transistor Liquid Crystal Display, thin film transistor-liquid crystal display) as a flat panel display device, because of its small size, low power consumption, no radiation and relatively low production cost, and more and more Ground is used in the field of high-performance display. [0003] The TFT-LCD display device may include an LCM (Liquid Crystal Module, liquid crystal display module). The LCM includes a liquid crystal display panel, a peripheral drive circuit, such as figure 1 The shown control circuit board 11, backlight module and other components. Wherein, the control circuit board 11 is provided with a display drive circuit, which can input control signals to make the display device perform screen display. The control circuit board 11 may include a ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G09G3/36G09G3/00G01R31/00
CPCG09G3/006G09G2330/04G09G3/36G02F1/1309G02F1/13306G02F1/1368G09G3/3648G09G2310/08
Inventor 徐帅张郑欣王智勇
Owner BOE TECH GRP CO LTD