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Method of calibrating and operating testing system

A testing system and testing machine technology, applied in the direction of measuring electricity, short-circuit testing, measuring devices, etc., can solve the problems of inability to accurately distinguish the assembly or aging of components, poor efficiency of the testing system, and long work for debugging.

Active Publication Date: 2015-07-01
MPI CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this correction method is to compensate the overall circuit of the detection system at one time, and cannot accurately distinguish the assembly or aging status of each component
In other words, when the calibration test finds a system failure, it is impossible to immediately know whether it is a machine failure or a probe failure. Instead, each component of the detection system must be disassembled and tested one by one to find out where the detection system is faulty. The work of debugging is too long, which leads to the inefficiency of repairing the detection system

Method used

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  • Method of calibrating and operating testing system
  • Method of calibrating and operating testing system

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Embodiment Construction

[0016] Please refer to figure 1 As shown, the detection system includes a detection machine 10, a conductive line set 20, a probe module 30 and a calibration module 40 electrically connected in sequence, and one end of the conductive line set 20 is provided with a first conductor made of Connector 21. The probe module 30 is provided with a second connector 31 made of conductor and corresponding to the first connector 21 . The calibration module 40 is also provided with four second connectors 41-44 made of conductors corresponding to the first connector 21, and the second connectors 41-44 are respectively electrically connected to the short circuit measurement, 50 ohm impedance Components corresponding to measurement, 75 ohm impedance measurement and open circuit measurement (not shown). In this embodiment, the first connector 21 is a male connector, and each of the second connectors 31, 4144 is a female connector, but it is not limited thereto. In other embodiments, in addit...

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Abstract

A method of calibrating and operating a testing system is provided, wherein the testing system has a test machine, a conducting wire set, a calibration module, and a probe module. The method includes the following steps: electrically connect the test machine and the conducting wire set; electrically connect the conducting wire set and the calibration module; send out electrical signals from the test machine to the calibration module for doing at least one test among a short-circuit test, an open-circuit test, and an impedance test, and then calibrate the testing system by correspondingly performing compensation based on results of these tests; electrically disconnect the conducting wire set and the calibration module, and electrically connect the conducting wire set and the probe module; abut the probe module against a DUT; send out electrical signals from the test machine to the probe module to do electrical tests on the DUT.

Description

technical field [0001] The present invention is related to electrical testing; in particular, it refers to a calibration and operation method of a testing system. Background technique [0002] With the rapid development of electronic products, in order to ensure the quality of electronic products when they leave the factory, inspection systems are usually used to detect whether the electrical connections between the precision electronic components of electronic products are correct before manufacturing, assembling and leaving the factory. [0003] In order to make the detection more accurate, before the detection system is tested, most of the probes of the detection system are contacted with a calibration sheet to compensate the detection value (such as zeroing). However, this correction method compensates the entire circuit of the detection system at one time, and cannot accurately distinguish the assembly or aging status of each component. In other words, when the calibra...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R35/00G01R31/08G01R31/50
CPCG01R31/025G01R35/005G01R31/2808G01R31/2851G01R31/68G01R31/52G01R31/50
Inventor 顾伟正吕绍玮蔡守仁王友泽
Owner MPI CORP