An Improved Analog Circuit Fault Diagnosis Method

Abstract

An improved analog circuit fault diagnosis method, which improves the traditional technology from two aspects: 1. For the improvement of the DAGSVM method, the SVM with the largest inter-class distance is used as the top node of the DAGSVM. If the root node classification result is class i , select the SVM with the largest distance from class i as the child node of this layer. If the classification result of the root node is class j, select the SVM with the largest distance from class j as the child node of this layer; if the classification result does not belong to Class i does not belong to class j, then exclude these two classes, select the two classes of SVM with the largest inter-class distance Dij among the remaining classes as the nodes of this layer and continue the above two steps until the diagnosis result is obtained. Doing so can effectively avoid high-level nodes from diagnosing errors and causing errors in the final result. 2. In order to improve the diagnostic accuracy of each sub-node, the particle swarm optimization algorithm (PSO) is used to optimize the parameters of each sub-SVM to improve the SVM diagnostic accuracy of each node, so as to improve the diagnostic accuracy of the entire DAGSVM.

Description

technical field [0001] The invention relates to the field of analog circuit fault diagnosis, in particular to an improved analog circuit fault diagnosis method. Background technique [0002] With the continuous development of electronic technology and computer technology, the structure of equipment is becoming more and more complex. However, the analog circuit in the equipment is often prone to problems, resulting in high test time and test cost. With the development trend of circuit structures expanding and becoming more and more complex, the difficulty of testing has also become higher. The scale and complexity of modern circuit systems are getting larger and higher, and the requirements for reliability and fault diagnosis of circuit systems are also increasing. Theoretical analysis and practical application show that analog circuits are more prone to failure than digital circuits. Although digital circuits in electronic equipment exceed 80%, more than 80% of the failure...

AI Technical Summary

Problems solved by technology

The DAGSVM algorithm also has certain problems: when the classification result of the previous node is wrong, the classification result of the subsequent node is also wrong, so that the correct result cannot be obtained.

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