Substrate carrying device
A substrate-carrying and substrate-based technology, which is applied in the direction of electrical components, semiconductor/solid-state device manufacturing, circuits, etc., can solve the problems of high processing costs, low efficiency, and high surface shape requirements, so as to improve production efficiency and avoid winding and twisting Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0035] figure 1 It is a schematic diagram of the system structure of the substrate inspection equipment, such as figure 1 As shown, the measuring head 106 is mounted on a mechanical support 107, and the mechanical support 107 may have different structures such as gantry or single-arm support. The wafer stage 105 is fixed on the Z-axis rotary stage Rz stage 104 and is located between the Rz stage 104 and the measuring head 106 . The Rz stage 104 is fixed on the adapter plate 103, and there may be some or all of the X-Y-Z direction adjustment stages 102 on the lower part of the adapter plate 103. The structural form of the mechanical support 107 and the number of X-Y-Z stages 102 do not affect the implementation of this solution.
[0036] The cross-sectional view of the internal mechanism of the wafer holder 105 of the present invention is as follows figure 2 and 3 As shown, two air pipes 208 pass through the adapter plate 103 and are connected to the pipe joint 207, and th...
Embodiment 2
[0042] replaceable, figure 2 The cylinder 205 in the cylinder can also be replaced by a hydraulic cylinder. Specifically, except that the gas source is replaced by a liquid source, its structure is exactly the same as that of the cylinder, except that the medium for execution is different, and the gas is replaced by liquid.
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 