Parallel multi-station test system and test method thereof

A testing system and functional testing technology, which is applied in the transmission system, electronic circuit testing, radio frequency circuit testing, etc., can solve the problems of increased testing cost, unusable testing equipment, inability to transplant or reuse, etc., to reduce the number of machines, The effect of saving production test cost

Inactive Publication Date: 2015-09-23
LITE ON ELECTRONICS (GUANGZHOU) LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Due to mutual incompatibility, each test instrument requires its own proprietary hardware and software components, which cannot be used on other test instruments
In addition, porting a test program from one test instrument to another and developing a third-party solution requires a lot of effort, and even if a third-party solution is developed for one platform, it cannot be ported or reused on another. On one platform, the process of translating from one platform to another is usually complex and error-prone, requiring more effort, time, and increased testing costs

Method used

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Embodiment Construction

[0041] Various exemplary embodiments will be described more fully hereinafter with reference to the accompanying drawings, in which some exemplary embodiments are shown. However, inventive concepts may be embodied in many different forms and should not be construed as limited to the illustrative embodiments set forth herein. Rather, these exemplary embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the inventive concept to those skilled in the art. In the drawings, the size and relative sizes of layers and regions may be exaggerated for clarity. Like numbers indicate like elements throughout.

[0042] It will be understood that, although the terms first, second, third etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are used to distinguish one element from another. Thus, a first element discussed below could be termed a second element without...

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Abstract

A parallel multiplex test system is disclosed. The parallel multiplex test system is used for testing N devices under test (DUTs) in the N isolation boxes via N test signals through N test channels. The parallel multiplex test system comprises a central processing unit and N function-test modules, wherein N is a positive integer greater than one. The parallel multiplex test system requests the function-test modules to take the function-tests for N DUTs according to the test items which have not been tested, so that different function-tests are taken for all of the DUTs simultaneously through different channels.

Description

technical field [0001] The invention relates to a test system and a test method, in particular to a test system and a test method with parallel multiplexing capability. Background technique [0002] A major reason for the high price of test instruments is the proprietary nature of traditional test instrument architectures. Every test instrument manufacturer has several test instrument architectures, which are not only incompatible among manufacturers such as Advantest, Teradyne, and Agilent, but also within the same manufacturer such as Advantest. The launched T3300, T5500, and T6600 series are also incompatible. Due to mutual incompatibility, each test instrument requires its own dedicated hardware and software components, which cannot be used on other test instruments. In addition, porting a test program from one test instrument to another and developing a third-party solution requires a lot of effort, and even if a third-party solution is developed for one platform, it ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01D21/00
CPCG01R31/28G01R27/28G01R31/2815G01R31/2822H04B17/0085
Inventor 江宗南连圣贤郑克勇宋锡祥傅宪杰
Owner LITE ON ELECTRONICS (GUANGZHOU) LTD
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