Accelerated storage test method for electronic equipment

A technology for accelerated storage test and complete machine, applied in the field of accelerated storage test, can solve the problem of lack of accelerated storage test method for complete machine products

Active Publication Date: 2015-10-21
BEIJING INST OF STRUCTURE & ENVIRONMENT ENG +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to provide a kind of accelerated storage test method for electronic complete machine aiming at the problem that the prior art lacks the accelerated storage test method for the whole product

Method used

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  • Accelerated storage test method for electronic equipment
  • Accelerated storage test method for electronic equipment
  • Accelerated storage test method for electronic equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0050] This embodiment provides an accelerated storage test method for electronic complete machines. In this method, the storage life cycle of electronic products is considered to include four processes including pick-up and transportation, warehouse storage, field work, and annual testing. The storage stresses considered are temperature, humidity , Transportation vibration stress and electrical stress. This method comprises the steps in turn:

[0051] Step 1. Pick-up and transportation stage

[0052] The pick-up and transportation stage of electronic products includes railway transportation and road transportation. In the test, an electromagnetic vibrating table is used to provide vibration stress for electronic products to accelerate the simulation of the actual situation of railway transportation and road transportation. Place the product to be tested in the packing box, and then fix the packing box on the electromagnetic vibration table,

[0053] Step 1.1 Railway transpo...

Embodiment 2

[0094] Below in conjunction with Embodiment 1, the receiver product on a certain vehicle is taken as the product to be tested, which belongs to the intelligent instrument product in the control system, and the present invention will be further described in detail.

[0095] Step 1. Determine the test conditions and time of the pick-up and transportation stage

[0096] The pick-up and transportation stage of this product includes railway transportation and road transportation. The cumulative transportation distance of one railway transportation is 8000km, so according to the formula (1), the test time is 6.4h, the temperature environment is normal temperature environment, the product is placed in the packing box, and the packing box fixed on a vibrating table. The test conditions are shown in the table below:

[0097] Table 3. Vibration stress conditions of a receiver railway transportation

[0098]

[0099] The accumulative transportation distance of one road transportatio...

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Abstract

The present invention belongs to the field of accelerated storage test methods in reliability and life tests, and especially relates to an accelerated storage test method for electronic equipment. The technical scheme of the accelerated storage test method is characterized in that: the accelerated storage test method makes a comprehensive stress accelerated storage test profile equivalent with one-year nature storage by combining comprehensive analysis for a full life cycle profile of an electronic product and considering influences of stresses such as transportation, temperature and humidity, the accelerated storage test method comprises four processes, i.e., packaging and transportation, storehouse storage, field work, and annual test, the accelerated storage test is performed under the profile, and the storage life of the product is verified according to the complete test time. The accelerated storage test method has the beneficial effects that: the accelerated storage test method is suitable for control system type of products, measuring type of products, and other types of electronic products in aerospace and vehicle-mounted electronic products; the profile covers prescribed environment conditions of storehouse storage and field work within the life cycle of the product, can verify the storage life of the product within short time and can motivate storage weak links, thereby providing data support for development and approval of the product.

Description

technical field [0001] The invention belongs to the field of accelerated storage test methods in reliability and life tests, and in particular relates to an accelerated storage test method for electronic complete machines. Background technique [0002] Electronic products are an important part of the industrial field, and a large number of electronic products are used in the fields of vehicles, railways, information systems, and aerospace. With the gradual improvement of product life and quality requirements by users, various fields have put forward storage life index requirements for electronic products. Different products have different requirements. The shortest is 8 years, and the longest storage life is 20 years. Accelerated storage tests need to be carried out to find out the changing rules of product storage performance indicators earlier in the design and development stage, verify whether the product storage life meets the specified storage life requirements, and at ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
Inventor 陈津虎杨学印王冀宁朱曦全胡彦平李星宫晓春王薇邹粟辛克浩
Owner BEIJING INST OF STRUCTURE & ENVIRONMENT ENG
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