Retrieval method for vertical exploration ionogram

Abstract

The invention discloses a retrieval method for a vertical exploration ionogram. The retrieval method comprises the following steps: S1: establishing a mathematical model of an ionized layer profile, wherein the model is a three-layer model which comprises an E layer, a grain layer and an F layer; S2) calculating the reflection echo virtual height of each layer, and deducing the calculation formulas of the echo virtual heights of the E layer and the F layer on the basis of an established ionized layer model; and S3) utilizing actual measurement ionogram data to combine with the calculation results of the echo virtual heights of the E layer and the F layer to carry out the retrieval of the ionized layer parameters of the E layer, the grain layer and the F layer. The retrieval method for the vertical exploration ionogram overcomes the defects in the prior art, and proposes a retrieval method, which carries out constrained optimization on the F layer parameters on the basis of a shifted chebyshev polynomial model, for the vertical exploration ionogram, the high-area echo tracing data of the F layer is selected after grain layer parameters are obtained, an F-layer profile multinomial coefficient is calculated under a constraint condition that the profile is guaranteed to be continuous and smooth, finally, the ionized layer profile is determined, and the precision and the stability of retrieval can be effectively improved.

Description

technical field [0001] The invention relates to the field of ionospheric research and application, in particular to a method for inverting ionospheric parameters by using a vertical ionogram. Background technique [0002] Using the vertical ionogram to invert the ionospheric profile (the correspondence between the height of the ionosphere and the plasma frequency or electron concentration) has been widely valued by people. At present, the vertical ionogram inversion methods can be summarized into the following two types: ① direct Calculation method, which directly uses the measured false height to calculate the real reflection height of the corresponding frequency (abbreviated as true height), mainly including slice method, single polynomial method, overlapping polynomial method, etc. Some of these methods are based on the establishment of true height and false height. Simultaneous equations, directly solve the true height based on the actual measured virtual height, such as...

AI Technical Summary

Problems solved by technology

The disadvantage of this method is that the valley parameters and the polynomial coefficients of the F layer profile are determined by directly using the data selected for inversion of the valley parameters, so that the vertical ionogram synthesized based on the inversion results and the measured ionogram The echo tracing deviation is larger in the higher area of ​​the F layer

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