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CCD spectral image dark current correction method for imaging spectrometer

A dark current correction, imaging spectrometer technology, applied in spectrometry/spectrophotometry/monochromator, instruments, scientific instruments, etc. Inversion accuracy, achieve accurate calculation, and improve the effect of imaging quality

Active Publication Date: 2016-08-10
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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Problems solved by technology

At present, the existing technology uses CCD dark pixels to estimate the dark current level. The problem is that the average value of the dark signal is used as the dark current of the entire image surface, and the non-uniformity of the dark signal response is ignored, and the error after correction is relatively large.

Method used

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  • CCD spectral image dark current correction method for imaging spectrometer
  • CCD spectral image dark current correction method for imaging spectrometer
  • CCD spectral image dark current correction method for imaging spectrometer

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Embodiment Construction

[0027] The present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0028] The present invention is a method for correcting dark current of a CCD spectral image of an imaging spectrometer, and the specific steps are as follows:

[0029] Use the dark pixels on both sides of the CCD imaging area to estimate the dark current of the entire image surface, and use two spectral images with different brightness to obtain the dark current non-uniformity matrix of the two-dimensional imaging surface, so as to calculate the actual dark current level of the image, It is subtracted to achieve dark current correction of spectral images. The specific implementation method is as follows:

[0030] Step 1. According to the dark pixel of the CCD as the dark current reference, the average value of the response of the dark pixel in each row (spectral dimension) of the CCD is used as the dark current of its spatial dimension position...

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Abstract

The invention discloses a CCD spectral image dark current correction method for an imaging spectrometer. The method comprises: an average CCD spectral-dimensional dark pixel response value is used as a corresponding spatial-dimensional average dark current to form an average dark current of an overall image plane; according to spectral images under different brightness, a dark pixel response non-uniformity correction matrix is calculated; the average dark current of the image plane adds to the dark pixel correction matrix to obtain an actual dark current of the image plane; and then deduction of the actual dark current is carried out to realize CCD spectral image dark current correction. According to the invention, spectral image dark current correction based on the CCD dark pixel is realized; and the dark signal response non-uniformity noises are eliminated. The method is reliable and is easy to implement; and the imaging quality of the imaging spectrometer is enhanced.

Description

technical field [0001] The invention belongs to the field of spectral image correction of a CCD imaging spectrometer, in particular to a dark current correction method for a CCD spectral image of an imaging spectrometer. Background technique [0002] The system structure of CCD ultraviolet imaging spectrometer is as attached figure 1 As shown, the system consists of ultraviolet lens, CCD drive control unit, data transmission system, motor and temperature control system, spectrometer and control computer. Using the imaging system based on the area array CCD detector, the concentration distribution of the polluted gas in one direction is realized by one measurement, and the spatial dimension is obtained by systematic scanning. The light information scattered and reflected from the surface is collected by the front telescope of the system, and then enters the relay optical system. The light reflection of the corresponding spectral band is converged into the Offner structural ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/28
CPCG01J3/2823
Inventor 张泉司福祺
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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