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Method and system for rapidly recognizing defects of big-breadth PCB on basis of connected areas

A PCB board and identification method technology, applied in the direction of optical testing flaws/defects, instruments, measuring devices, etc., can solve the problems of complicated PCB board detection algorithm and indeterminate defect category, and achieve the effect of simple algorithm

Active Publication Date: 2015-11-25
SHENZHEN UNIV
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Problems solved by technology

[0006] The technical problem to be solved by the present invention is to provide a method and system for rapid identification of large-format PCB board defects based on connected domains, which aims to solve the problem that the current PCB board detection algorithm is complicated and the defect type cannot be determined

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  • Method and system for rapidly recognizing defects of big-breadth PCB on basis of connected areas
  • Method and system for rapidly recognizing defects of big-breadth PCB on basis of connected areas
  • Method and system for rapidly recognizing defects of big-breadth PCB on basis of connected areas

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[0052] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0053] Binarize the collected PCB scan image, extract the Gerber file of the PCB and convert it into a standard image, and process the two to obtain two images of the same size, as shown in figure 1 (a) and 1(b) are a detected scanned image and the corresponding standard image, respectively. figure 1 (c) is the result of the difference between the scanned image and the standard image.

[0054]Notice that there are more pixels in the difference image after direct difference between the scanned image and the standard image, which indicate that the scanned image is not completely consistent with the ...

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Abstract

The invention is applied to the field of printed-circuit board (PCB) monitoring and provides a method and system for rapidly recognizing defects of a big-breadth PCB on the basis of connected areas. Connected areas of all object regions are respectively extracted and identified, calculating screening is carried out according to characteristic quantity of the connected areas, some connected areas which are in the allowable error range and are the same basically are deleted, a defect connected area scanning image and a corresponding defect connected area standard image are screened out, a difference between the two images is found out through difference image analysis and finally defect identification of the PCB is completed. According to the invention, defect types are judged according to number change of connected areas caused by the defects of the PCB, the algorithm is relatively simple, and typical defects such as short circuit, open circuit, residual copper and wire shortage of the PCB can be detected through image matching, connected area search and difference image analysis.

Description

technical field [0001] The invention belongs to the field of detection and identification of printed circuit boards, in particular to a method and system for quickly identifying defects of large-format PCBs based on connected domains. Background technique [0002] At present, there are three types of detection and identification methods for PCB (Printed Circuit Board, printed circuit board) substrate defects: reference comparison method, non-reference comparison method and hybrid method. [0003] (1) Reference comparison method: This method is to compare the reference standard image with the detected image, that is, XOR operation. This method has a simple algorithm, the fastest speed, and is easy to implement, but it cannot determine the defect category. [0004] (2) Non-reference comparison method: This method does not need to refer to the image. It judges whether the PCB image to be inspected is flawed according to the predefined design rules. If it does not meet the desig...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88G01R31/02
Inventor 程涛孙高磊冯平徐刚王燕燕
Owner SHENZHEN UNIV