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Method and device for generating test data

A technology of test data and data configuration, applied in the computer field, can solve the problem of test data consuming a lot of time and manpower

Inactive Publication Date: 2015-11-25
ZTE CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a method and device for generating test data to solve the problem that the generation of test data in the prior art requires a lot of time and manpower

Method used

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  • Method and device for generating test data
  • Method and device for generating test data
  • Method and device for generating test data

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Embodiment Construction

[0021] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0022] like figure 1 As shown, embodiments of the present invention provide a method for generating test data, including:

[0023] S11, acquiring data structure information and data configuration information of each data table in the database system;

[0024] S12. Randomly generate a preset number of test data according to the data structure information and the data configuration information, and distinguish the preset number of test data from the business function test data of the database system.

[0025] The method for generating test data provided by the embodiments of the present invention can acquire the data structure information and data configuration information...

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Abstract

The present invention relates to the technical field of computers. Provided are a method and a device for generating test data, which are used to solve the problem in the prior art that the generation of test data consumes huge time and labor. The method comprises: acquiring data structure information and data configuration information of all data tables in a database system; and randomly generating a preset number of pieces of test data according to the data structure information and the data configuration information, the preset number of pieces of test data being distinguished from service function test data of the database system. The present invention can be applied to the program performance test of the database system.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to a method and device for generating test data. Background technique [0002] In the development process of the database system, sql (StructuredQueryLanguage, Structured Query Language) is distributed in multiple application modules and written by multiple application developers. Since the business level and programming habits of each developer are different, so The overall performance of the sql program is difficult to guarantee and needs to be tested and verified with a lot of test data. However, the structure of the database system is complex, the amount of data is usually very large, and the data logic between the database systems of different businesses is different. It takes a lot of time and manpower to construct test data that meets the requirements. [0003] Aiming at the problem that the generation of test data in related technologies requires a lot of time and manpowe...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/30
CPCG06F11/36
Inventor 姜志强孙放宽
Owner ZTE CORP
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