Measuring system for the size of individual nanoparticles
A nanoparticle and measurement system technology, applied in the field of optical measurement, can solve the problems of slow measurement speed, inability to measure a single particle, complicated and expensive, etc., and achieve the effects of easy operation, fast measurement, and low measurement cost.
Active Publication Date: 2018-06-15
TSINGHUA UNIV
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Problems solved by technology
The microscopic imaging method can accurately measure the particle size of a single metal nanoparticle, but it requires complex and expensive instruments and equipment, and has the disadvantages of slow measurement speed and low efficiency; the scattering measurement method is mainly divided into dynamic light scattering method, Small-angle X-ray scattering, scattering spectroscopy, etc.
Scatterometry can quickly measure the size and distribution of large samples of nanoparticles, but cannot measure individual particles
[0004] In practical applications, it is desirable to achieve rapid measurement of individual nanoparticles, but current methods are not well suited to meet this need
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[0020] The system and method for measuring the particle size of a single nanoparticle provided by the present invention will be described in detail below with reference to the accompanying drawings. For the convenience of description, the present invention firstly introduces the measurement system of the particle size of a single nanoparticle.
[0021] see figure 1 , the first embodiment of the present invention provides a measurement system 100 for the particle size of a single nanoparticle, the measurement system 100 for the particle size of a single nanoparticle includes a light source 1, a dark field concentrator module 20, and an object stage 4 , objective lens 5, convex lens 6, CCD and its controller 7, data line 8 and display and processing unit 9. The dark field condenser module 20 , stage 4 , objective lens 5 , convex lens 6 , CCD and its controller 7 are sequentially arranged at intervals along the optical path output by the light source 1 . The light emitted by th...
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Abstract
The invention relates to a measuring system for grain size of a single nanometer grain. The measuring system comprises a light source, a dark field condensator module, an objective table, an objective lens, a convex lens, a CCD (Charge Coupled Device) and a controller thereof, a data line and a display and treating unit which are successively arranged at intervals, wherein the monochromatic light emitted from the light source becomes a hollow light cone after the monochromatic light is reshaped by the dark field condensator module; the monochromatic light is irradiated on the objective table and then the scattering light is generated; the scattering light passes through the objective lens and the convex lens; lastly, an image is formed on the CCD and the controller thereof; the image is transmitted to the display and treating unit through the data line.
Description
technical field [0001] The invention relates to the field of optical measurement, in particular to a measurement system and a measurement method for rapidly measuring the diameter of a single nanoparticle by using dark field scattering intensity to measure nanoparticles. Background technique [0002] Because metal nanoparticles have a nanometer-scale particle size, they have many special effects, such as small size effects, surface effects, quantum effects, and macroscopic quantum tunneling effects, so that they can be used in light, electricity, sound, heat and other physics. Properties exhibit special properties that are quite different from traditional bulk materials. Many properties of metal nanoparticles are closely related to their particle size, so the measurement and characterization of the particle size of metal nanoparticles has important scientific research and practical significance. [0003] The main methods currently used to measure the particle size of metal ...
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IPC IPC(8): G01N15/02
Inventor 白本锋肖晓飞
Owner TSINGHUA UNIV