Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Automatic make-up examination platform system

A platform, automatic technology, applied in the network field, which can solve the problems of time and geographical limitations

Inactive Publication Date: 2016-01-20
SHENYANG CHUANGDA TECH TRADE MARKET
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Existing make-up examination methods have time and geographical limitations

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0007] Embodiment 1: An automatic re-examination platform system includes a client, a switch and a server, and the server includes a user login unit, a user registration unit, a re-examination course selection unit, a re-examination teacher selection unit, an examination registration time reservation unit, and a pre-examination training appointment Unit, knowledge point display unit, result announcement unit, make-up exam payment calculation unit, payment unit.

Embodiment 2

[0008] Embodiment 2: An automatic re-examination platform system includes a client, a switch and a server, and the server includes a user login unit, a user registration unit, a re-examination course selection unit, a re-examination teacher selection unit, an examination registration time reservation unit, and a pre-examination training appointment unit, knowledge point display unit, and achievement announcement unit.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an automatic make-up examination platform system which is not restricted by time and region. According to the adopted technical scheme, the automatic make-up examination platform system comprises a client, a switch and a server; and the server comprises a user login unit, a user registration unit, a make-up examination course-choosing unit, a make-up examination teacher selection unit, an examination registration time reservation unit, a pre-examination training reservation unit, a knowledge point showing unit, a result announcement unit, a make-up examination payment calculation unit and a payment unit.

Description

technical field [0001] The invention belongs to the field of network technology, in particular to an automatic re-examination platform system. Background technique [0002] No matter how many subjects the student failed in the academic year, they are required to take the re-examination. Students who fail to take the exam due to illness or other special reasons are allowed to make up the exam. Students who violate discipline in exams may be allowed to make up exams after being criticized and educated. Make-up exams are generally scheduled within the first two weeks of the semester. The scope, level of difficulty and scoring criteria of the test questions shall be the same as those of the academic year examinations. The existing make-up examination methods have time and geographical limitations. Contents of the invention [0003] The technical problem to be solved is to overcome the defects of the existing technology and provide an automatic re-examination platform syste...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04L29/08G06Q10/06G06Q50/20
Inventor 栾晓健
Owner SHENYANG CHUANGDA TECH TRADE MARKET
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products