Diode failure analysis device

Abstract

The invention discloses a diode failure analysis device and belongs to the diode detection field. The diode failure analysis device comprises a box body and a reactor; the box body is a rectangular box; a feeding opening is formed at the upper end of the box body; two supporting arms arranged side by side are fixed at one side of the inner wall of the box body; the middle of the reactor is hinged between the two supporting arms; an air cylinder is fixed onto the inner wall of the top end of the box body; the output end of the air cylinder is connected with a telescopic rod; a connecting rod is hinged to the telescopic rod; one end of the connecting rod is hinged to the reactor; the inner wall of the box body is provided with a guide groove which is located below the supporting arms; the bottom of the interior of the box body is provided with a waste liquid collecting box; and the bottom end of the guide groove extends into the waste liquid collecting box. With the diode failure analysis device of the invention adopted, multiple times of heating corrosion of a diode failure analysis test can be completed, and an operator does not need to directly contact with the reactor; and waste acid liquid can be recycled in a centralized manner; and therefore, the risk of the test can be lower, pollution to the environment can be reduced, and a greater environmentally-friendly property can be realized, and a failure analysis test can be performed on a diode more conveniently.

Description

technical field [0001] The invention relates to the field of diode detection, in particular to a diode failure analysis device. Background technique [0002] During long-term use, diodes will fail due to various reasons and cannot work normally, which will seriously affect the normal use of electronic devices. In order to reduce the occurrence of diode failure, failure analysis experiments are usually carried out on failed diodes to find out the cause of diode failure, and then make targeted improvements to the diode. The experimental process is to collect samples of short-circuit failures in the use of diodes and screen failure data such as stress conditions or service conditions, and conduct electrical parameter tests, cap removal, protective glue removal, die and electrode separation, solder removal, and microscopic observation of these samples. Steps to find out the failure location, analyze the internal quality factors or use factors that cause the diode failure, and t...

AI Technical Summary

Problems solved by technology

[0002] During long-term use, diodes will fail due to various reasons and cannot work normally, which will seriously affect the normal use of electronic devices

The existing experiment is a manual operation, which requires manual contact with various strong acids. The beaker needs to be heated through an alcohol lamp and an asbestos net. After each corrosion, the operator needs to manually remove the beaker to discharge the used acid. The labor intensity is high and it is easy to fatigue. The acid liquid volatilized during the corrosion process will cause irritating damage to the operator's eyes and respiratory tract, and there is a certain degree of instability and danger.

Moreover, the waste acid liquid after corrosion is not treated centrally, and the discharge is not standardized, which will easily pollute the environment.

The labor cost of the experiment is high, the efficiency of the manual failure analysis experiment is low, and it is very inconvenient to perform the failure analysis experiment on the diode

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