Edge position detection device and edge position detection method
An edge position and detection device technology, applied in the field of edge position, can solve the problems of smaller gradient, lower contrast, and inability to detect edge position, etc.
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[0045] figure 1 It is a diagram showing a schematic configuration of a pattern measuring device 1 according to an embodiment of the present invention. The pattern measurement device 1 measures the width (namely, line width) of a linear pattern unit on a pattern formed on an object, that is, a semiconductor substrate, a glass substrate, or a printed circuit board (hereinafter, simply referred to as "substrate 9"). Automatic length measuring machine.
[0046] The pattern measuring device 1 has a table 21 , a table driving unit 22 , and an imaging unit 3 . The table 21 is used to hold the substrate 9 . The table drive unit 22 relatively moves the table 21 with respect to the imaging unit 3 . The table driving unit 22 is composed of a ball screw, a guide rail, a motor, and the like. The imaging unit 3 is disposed above the table 21 (ie, on the (+z) side), and captures image data of an inspection target region on the substrate 9 . The imaging unit 3 has an illumination unit 31...
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