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led aging tester

A tester and substrate technology, applied in the field of LED aging tester, can solve the problems of poor contact between metal tubes and pole feet, acceleration, loose metal tubes, etc., and achieve the effects of good contact, long service life and simple structure

Active Publication Date: 2018-09-28
达测科技(广州)股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] During the production and processing of in-line LED lamps, the entire finished LED lamp beads need to be tested for conventional aging, accelerated aging, and light decay in the later stage. There are several LED lamp bead sockets distributed on the current LED aging tester. It is used to test the performance of LED lamp beads. The current lamp bead sockets are all in contact with the LED lamp pole pins. Conductive metal tubes. After long-term assembly and disassembly, the metal tubes will loosen, resulting in poor contact between the metal tubes and the pole pins.

Method used

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Embodiment Construction

[0016] The present invention will be further described below in combination with specific embodiments.

[0017] Such as figure 1 As shown, an LED aging tester according to an embodiment of the present invention includes a frame 1 , a substrate 2 , a first connecting wire 3 and sockets 4 , the substrate 2 is installed in the frame 1 , and several sockets 4 are mounted on the substrate 2 .

[0018] Such as figure 2 As shown, the socket 4 includes a body 41 , a socket 42 , a contact 43 and a second connection wire 44 . The body 41 is an insulator, so as to ensure the safety during use and detection. The body 41 is provided with a plurality of sockets 42, and the number of sockets 42 is optimally 4. If socket 42 quantity is too many, there is socket 42 contacting and going wrong just needs whole socket to be changed, is unfavorable for repairing and maintaining. A contact piece 43 is provided directly below the socket 42, and the contact piece 43 is directly connected to the ...

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Abstract

The invention discloses an LED aging testing instrument. The LED aging testing instrument comprises a frame, a substrate, a first connecting wire and sockets; the substrate is installed in the frame; the substrate is provided with the plurality of sockets; the socket comprises a body, jacks, contact components and second connecting wires, wherein the plurality of contact components are arranged in the body, the jacks are arranged on the body and are aligned with the contact components, and each contact component includes a plurality of contact bodies, a spring and a mounting body, wherein the contact bodies form a ring through encircling and are fixed through the spring, and the mounting body is arranged on the body contacts; the connecting wires are connected with the mounting bodies. The LED aging testing instrument of the invention has the advantages of simple structure, excellent contact, long service life, safety and reliability.

Description

technical field [0001] The invention belongs to the field of LED lamp detection equipment, and more specifically relates to an LED aging tester. Background technique [0002] During the production and processing of in-line LED lamps, the entire finished LED lamp beads need to be tested for conventional aging, accelerated aging, and light decay in the later stage. There are several LED lamp bead sockets distributed on the current LED aging tester. It is used to test the performance of the LED lamp bead. The inside of the current lamp bead socket is in contact with the pole pin of the LED lamp is a conductive metal tube. After long-term assembly and disassembly, the metal tube will loosen, resulting in poor contact between the metal tube and the pole pin. Contents of the invention [0003] In order to solve the above problems, the present invention provides a LED aging tester with simple structure, good contact, long service life, safety and reliability. [0004] According ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/04G01R31/44
CPCG01R1/0416G01R31/44
Inventor 胡清辉高芬胡建柏云杨明周
Owner 达测科技(广州)股份有限公司