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Continuous high and low temperature test device

A high and low temperature test, continuous technology, applied in the field of detection, can solve the problems of single heating or cooling mode, discontinuous temperature change, unfavorable accurate test, etc., to achieve the effect of strong test reliability, long service life and novel structure

Inactive Publication Date: 2016-03-23
SUZHOU LECC TESTING TECH
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Problems solved by technology

One of the applications in the thermal field includes high and low temperature test devices. Most of the existing high and low temperature test devices use a single heating or cooling mode, and the temperature change is discontinuous, with single factors and distorted environmental simulation, which is not conducive to accurate testing.

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  • Continuous high and low temperature test device

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Embodiment Construction

[0016] The following will clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0017] Embodiments of the invention include:

[0018] A continuous high and low temperature test device includes: a shell, a two-stage heating cycle device, a two-stage refrigeration cycle device and a control device 3 .

[0019] The two-stage heating cycle device and the two-stage refrigeration cycle device are arranged in the housing, and the two-stage heating cycle device includes a primary heating cycle device 101, a primary heating control device 102, a secondary heating Circulation device 103 and secondary hea...

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Abstract

The invention discloses a continuous high and low temperature test device comprising a shell, a two-stage heating circulation device, a two-stage refrigerating circulation device and a control device. The two-stage heating circulation device comprises a primary heating circulation device, a primary heating control device, a secondary heating circulation device and a secondary heating control device. The two-stage refrigerating circulation device comprises a primary refrigerating circulation device, a primary refrigerating control device, a secondary refrigerating circulation device and a secondary refrigerating control device. Through the scheme, the continuous high and low temperature test device of the invention has the advantages of novel structure, heating and refrigerating device independent control, multiple modes of heating or cooling, controllable temperature change rate, continuous change, realistic environment simulation, high test reliability, stable performance, safety and reliability, long service life, convenience and practicality, and the like, and has a broad market prospect in the popularization of high and low temperature test devices.

Description

technical field [0001] The invention relates to the detection field, in particular to a continuous high and low temperature test device. Background technique [0002] Detection is widely used in various fields, mainly including electromagnetic, radio, time frequency, length, mechanics, quality, vibration, acoustics, optics, physics and chemistry, thermal engineering and maintenance, etc. One of the applications in the thermal field includes high and low temperature test devices. Most of the existing high and low temperature test devices use a single heating or cooling mode, and the temperature change is discontinuous, with single factors and distorted environmental simulation, which is not conducive to accurate testing. Contents of the invention [0003] The main technical problem to be solved by the present invention is to provide a continuous high and low temperature test device, which can be controlled independently and work independently or in cooperation by using the ...

Claims

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Application Information

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IPC IPC(8): G05D23/32
CPCG05D23/32
Inventor 朱迎晓张建华钱华
Owner SUZHOU LECC TESTING TECH
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