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Control method used for acquiring chip images

A control method and chip technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve problems such as inability to guarantee product quality, low efficiency of manual inspection chips, etc., and achieve high efficiency

Active Publication Date: 2016-03-23
CHONGQING YUANCHUANG PHOTOELECTRIC TECH CO LTD
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Problems solved by technology

[0004] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a control method suitable for acquiring chip images, which is used to acquire chip images for chip appearance inspection, so as to solve the problem of low efficiency of manual inspection of chips in the prior art. , unable to guarantee product quality and other issues

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  • Control method used for acquiring chip images
  • Control method used for acquiring chip images

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Embodiment Construction

[0018] The implementation of the present invention will be illustrated by specific specific examples below, and those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification.

[0019] It should be noted that the structures, proportions, sizes, etc. shown in the drawings attached to this specification are only used to match the content disclosed in the specification, for those who are familiar with this technology to understand and read, and are not used to limit the implementation of the present invention. Limiting conditions, so there is no technical substantive meaning, any modification of structure, change of proportional relationship or adjustment of size, without affecting the effect and purpose of the present invention, should still fall within the scope of the present invention. The disclosed technical content must be within the scope covered. At the same time, terms such as "upper"...

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Abstract

The invention provides a control method used for acquiring chip images. The method comprises the following steps of moving a chip framework on a guide rail; when the chip framework is detected to enter into from one end of the guide rail, lifting a block arranged on the other end of the guide rail; when the chip framework is detected to move to the block, making a camera arranged above the chip framework carry out motion shooting from a preset position along chip installation positions on the chip framework so as to acquire chip images on the installation position; when the chip images on the chip framework are all acquired, making the camera return to the preset position along an original motion path. Efficiency of the method is higher than efficiency of a method in the prior art, wherein a manual detection mode is adopted in the method in the prior art.

Description

technical field [0001] The invention relates to the field of chip detection, in particular to a control method suitable for acquiring chip images. Background technique [0002] Chips are one of the key technologies restricting the development and popularization of computers in our country. The bottleneck of chip development is manufacturing equipment and production technology. One of the important factors for whether Loongson can be popularized on computers in my country is that my country's chip manufacturing industry must master the production process of chips. There are many technologies involved in the production process, among which the appearance inspection in the chip manufacturing process is one of the important contents. At present, the appearance inspection system in the chip manufacturing process is basically the standard and technology of American INTEL and ADM companies. At present, there is no such chip appearance inspection system in our country. Therefore,...

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Application Information

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IPC IPC(8): H01L21/67
CPCH01L21/67242
Inventor 李志远耿世慧李熙春
Owner CHONGQING YUANCHUANG PHOTOELECTRIC TECH CO LTD
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