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Multifunctional loopback tester of 2M digit circuit

A technology for digital circuit and loopback testing, which is applied to instruments, measuring electronics, and measuring devices. It can solve problems such as long loopback operation time, short circuit of inner and outer cores, and weak contact of devices, achieving short loopback operation time and physical The effect of firm contact and avoiding damage

Inactive Publication Date: 2016-04-20
STATE GRID CORP OF CHINA +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The invention aims to solve the problems of weak device contact, long loopback operation time and easy short circuit of inner and outer cores during the loopback test of 2M digital circuits, thereby providing a multifunctional loopback tester for 2M digital circuits

Method used

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  • Multifunctional loopback tester of 2M digit circuit

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specific Embodiment approach 1

[0011] Specific implementation mode one: refer to figure 1 Specifically illustrate the present embodiment, the multifunctional loopback tester of the 2M digital circuit described in the present embodiment includes 2M coaxial cables and 2N 2M digital connectors 3, and the 2M coaxial cables include N 2M coaxial cable core wires 1 and 2M coaxial cable sheath 2, N 2M coaxial cable core wires 1 are covered with a shielding layer, the middle part of the 2M coaxial cable is covered with 2M coaxial cable sheath 2, and both ends are exposed, N 2M coaxial cables Both ends of the core wire of the shaft cable are respectively connected to 2N 2M digital connectors 3, where N is a positive integer.

specific Embodiment approach 2

[0012] Embodiment 2: This embodiment is a further description of the multifunctional loopback tester for 2M digital circuits described in Embodiment 1. In this embodiment, N is 4.

specific Embodiment approach 3

[0013] Specific embodiment three: this embodiment is to further illustrate the multifunctional loopback tester of the 2M digital circuit described in specific embodiment two, in this embodiment, one end of 4 2M coaxial cable core wires 1 is respectively connected to L9 2M digital connectors 3 of models, CC4 models, BNC models, and LEG models, and the other ends of the four 2M coaxial cable core wires 1 are respectively connected to 2M digital connectors 3 of L9 models, CC4 models, BNC models, and LEG models.

[0014] The model of the 2M digital connector 3 in the existing 2M digital circuit is usually an L9 model, a CC4 model, a BNC model or a LEG model. The 2M digital connector 3 of the above-mentioned model can be used in this embodiment to better cooperate with the existing circuit. easy to use.

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Abstract

A multifunctional loopback tester of a 2M digit circuit relates to the technical field of loopback tests for 2M digit circuits. In order to solve the problems of insecure contact between devices, long loopback operating time and high possibility of inside core and outside core short-circuit during a loopback test for a 2M digit circuit, the tester comprises a 2m coaxial cable and 2N 2M digital connectors, and two ends of N 2m coaxial cable cores are connected with the 2N 2M digital connectors respectively. The tester provided by the invention has the advantages of firm physical contact, no deficient contact, short loopback operating time (needing only about 10 seconds), rapid and accurate test result and failure judgment, no inside core and outside core short-circuit, and avoidance of damage to an 2M interface board. The multifunctional loopback tester is suitable for loopback tests of 2M digit circuits.

Description

technical field [0001] The invention relates to the technical field of loopback testing of 2M digital circuits. Background technique [0002] The 2M digital circuit is a fully transparent circuit channel that carries the optical fiber transmission backbone network for information transmission. It is the most widely used reference circuit in the optical fiber communication system. Therefore, it is extremely important for the maintenance and troubleshooting of the 2M digital circuit, and the 2M loopback test method is It is the most common and important means for maintenance and troubleshooting of 2M digital circuits. [0003] The loopback test of traditional 2M digital circuits generally uses audio jumpers. This method mainly has the following problems: [0004] 1. The physical contact is not tight, and virtual connections often occur, which affects the test results and the judgment of faults. [0005] 2. The loopback operation takes a long time, generally takes 2-3 minutes...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B10/073G01R31/02
CPCG01R31/58H04B10/073
Inventor 王义春刘长银李荣春李维赵俊涛韩力杰于波侯艳权姚越赵晨宇
Owner STATE GRID CORP OF CHINA